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Vapor Deposition  Pattern Transfer: Additive techniques-Physical and Chemical Vapor Deposition RAJEEV R PILLAI
Content ,[object Object],[object Object],[object Object],[object Object],[object Object],[object Object],[object Object],[object Object],[object Object],[object Object],[object Object],[object Object],[object Object],[object Object]
Physical vapor deposition (PVD) ,[object Object]
Physical vapor deposition (PVD): thermal evaporation 6 The number of molecules leaving a unit area of evaporant per second
Physical vapor deposition (PVD): thermal evaporation The cosine law This is the relation between vapor pressure of the evaporant and the evaporation rate. If a high  vacuum is established, most molecules/atoms will reach the substrate without intervening collisions. Atoms and molecules flow through the orifice in a single straight  track,or we have free molecular flow :  The fraction of particles scattered by collisions  with atoms of residual gas is proportional to:  The source-to-wafer distance must be smaler than the mean free path (e.g, 25 to 70 cm)
Physical vapor deposition (PVD): thermal evaporation  From kinetic theory the mean free path relates to the total pressure as:  Since the thickness of the deposited film, t, is proportional To the cos   , the ratio of the film thickness shown in the  Figure on the right with    = 0° is given as:
  Physical vapor deposition (PVD): sputtering  -V working voltage - i discharge current - d, anode-cathode distance - P T , gas pressure - k proportionality constant Momentum transfer
Evaporation  and  sputtering: comparison
Physical vapor deposition (PVD): MBE, Laser Ablation ,[object Object],[object Object],[object Object],[object Object],[object Object],[object Object],-
Physical vapor deposition (PVD): Ion cluster plating ,[object Object],[object Object],[object Object],[object Object],[object Object],[object Object],[object Object]
[object Object],[object Object],Physical vapor deposition (PVD):Ion cluster plating and  ion plating
Chemical vapor deposition (CVD): reaction mechanisms ,[object Object],[object Object],[object Object],[object Object],[object Object],[object Object],[object Object],[object Object],[object Object],[object Object],SiH4 SiH 4 Si
Chemical vapor deposition (CVD): reaction mechanisms ,[object Object],[object Object],[object Object],[object Object],[object Object],[object Object],(Fick’s first law) (gas viscosity   , gas density  , gas stream velocity U) (Dimensionless Reynolds number) (Boundary layer thickness) (by substitution in Fick’s first law and   x=  ) Laminar flow L  (x) dx (U)
[object Object],[object Object],Chemical vapor deposition (CVD) : reaction mechanisms
Chemical vapor deposition (CVD):  step coverage ,[object Object],[object Object],[object Object], w z        is angle of arrival
Chemical vapor deposition (CVD) : overview ,[object Object],[object Object],[object Object],[object Object],[object Object],[object Object],[object Object],[object Object]
[object Object],Chemical vapor deposition (CVD) : L-CVD
Epitaxy ,[object Object],[object Object],[object Object],[object Object],[object Object],Liquid phase epitaxy
Epitaxy ,[object Object],[object Object],[object Object],[object Object],[object Object],[object Object],[object Object],[object Object],Selective epitaxy
Electrochemical deposition: electroless ,[object Object],[object Object],[object Object],[object Object],[object Object],[object Object],[object Object],[object Object],[object Object],[object Object],[object Object],[object Object],[object Object],[object Object],[object Object],[object Object],Cu
Electrochemical deposition: electroless ,[object Object],[object Object],[object Object],[object Object],[object Object],Evan’s diagram F= 96,500 coulombs=1, 6 10  -19  (electron charge) x 6. 02 10  23  (Avogadro’s number) + -
Electrochemical deposition :electrodeposition-thermodynamics ,[object Object],[object Object],[object Object],[object Object],[object Object]
Electrochemical deposition :electrodeposition-thermodynamics (E) E 2  > E 1  : - battery E 2  < E 1  : + E  ext  > E  cell  to afford deposition (Nernst equation) 1. Free energy change for ion in the solution to atom  in the metal (cathodic reaction):  or also 2. The electrical work, w, performed in electrodeposition at constant pressure and constant temperature: and since   V =0 3. Substituting Equation (2) in (1) one gets (1) (2) 4. Repeat (1) and (2) for anodic reaction: or
Electrochemical deposition :electrodeposition-thermodynamics (  ) ,[object Object],[object Object],[object Object]
Electrochemical deposition :electrodeposition-kinetics-activation control ,[object Object],[object Object],(without field) (with field)
Electrochemical deposition :electrodeposition-kinetics-activation control ,[object Object],[object Object],[object Object],[object Object],(Butler-Volmer) (Tafel law)
Electrochemical deposition :electrodeposition-kinetics-diffusion control ,[object Object],[object Object],[object Object],[object Object],we get :
Electrochemical deposition :electrodeposition-non-linear diffusion effects ,[object Object],[object Object],[object Object],[object Object]
Electrochemical deposition :electrodeposition-non-linear diffusion effects ,[object Object],[object Object]
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CVD AND PVD THIN FILM TECHNIQUES

  • 1. Vapor Deposition Pattern Transfer: Additive techniques-Physical and Chemical Vapor Deposition RAJEEV R PILLAI
  • 2.
  • 3.
  • 4. Physical vapor deposition (PVD): thermal evaporation 6 The number of molecules leaving a unit area of evaporant per second
  • 5. Physical vapor deposition (PVD): thermal evaporation The cosine law This is the relation between vapor pressure of the evaporant and the evaporation rate. If a high vacuum is established, most molecules/atoms will reach the substrate without intervening collisions. Atoms and molecules flow through the orifice in a single straight track,or we have free molecular flow : The fraction of particles scattered by collisions with atoms of residual gas is proportional to: The source-to-wafer distance must be smaler than the mean free path (e.g, 25 to 70 cm)
  • 6. Physical vapor deposition (PVD): thermal evaporation From kinetic theory the mean free path relates to the total pressure as: Since the thickness of the deposited film, t, is proportional To the cos  , the ratio of the film thickness shown in the Figure on the right with  = 0° is given as:
  • 7. Physical vapor deposition (PVD): sputtering -V working voltage - i discharge current - d, anode-cathode distance - P T , gas pressure - k proportionality constant Momentum transfer
  • 8. Evaporation and sputtering: comparison
  • 9.
  • 10.
  • 11.
  • 12.
  • 13.
  • 14.
  • 15.
  • 16.
  • 17.
  • 18.
  • 19.
  • 20.
  • 21.
  • 22.
  • 23. Electrochemical deposition :electrodeposition-thermodynamics (E) E 2 > E 1 : - battery E 2 < E 1 : + E ext > E cell to afford deposition (Nernst equation) 1. Free energy change for ion in the solution to atom in the metal (cathodic reaction): or also 2. The electrical work, w, performed in electrodeposition at constant pressure and constant temperature: and since  V =0 3. Substituting Equation (2) in (1) one gets (1) (2) 4. Repeat (1) and (2) for anodic reaction: or
  • 24.
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