Marcadores
electronic design automation
electrical engineering
electronics
electronic engineering
fault simulation
test generation
fault modelling
electronic test
low-power design
design/test verification
sic bs lfsr
fault coverage
electronics engineering
software testing
software
debugging
power
electricity
waves
sounds
elearning
built-in self-test
synthesis of testability
design of testability
analytical approach for modeling.
optimization of technological process
three-stage amplifier circuit
field-effect heterotransistors
ic/module design
• test generation
• design/test verification
• electronic design automation
• fault modelling
• low-power design
• ic/module design
analytical approach for prognosis of technological
optimization of manufacturing
comparator circuit
field-effect heterotransistor
multi vth transistor
boosted voltage
half-select
bit interleaving
sub-threshold sram
Ver mais
Documentos
(10)Marcadores
electronic design automation
electrical engineering
electronics
electronic engineering
fault simulation
test generation
fault modelling
electronic test
low-power design
design/test verification
sic bs lfsr
fault coverage
electronics engineering
software testing
software
debugging
power
electricity
waves
sounds
elearning
built-in self-test
synthesis of testability
design of testability
analytical approach for modeling.
optimization of technological process
three-stage amplifier circuit
field-effect heterotransistors
ic/module design
• test generation
• design/test verification
• electronic design automation
• fault modelling
• low-power design
• ic/module design
analytical approach for prognosis of technological
optimization of manufacturing
comparator circuit
field-effect heterotransistor
multi vth transistor
boosted voltage
half-select
bit interleaving
sub-threshold sram
Ver mais