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A scanning electron microscope is a type of electron microscope that produces images of a sample by scanning the surface with a focused beam of electrons. The electrons interact with atoms in the sample, producing various signals that contain information about the sample's surface topography and composition. SEMs can magnify an object from about 10 times up to 300,000 times. A scale bar is often provided on an SEM image. From this the actual size of structures in the image can be calculated.
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A scanning electron microscope is a type of electron microscope that produces images of a sample by scanning the surface with a focused beam of electrons. The electrons interact with atoms in the sample, producing various signals that contain information about the sample's surface topography and composition. SEMs can magnify an object from about 10 times up to 300,000 times. A scale bar is often provided on an SEM image. From this the actual size of structures in the image can be calculated.
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![SCANNING ELECTRON MICROSCOPE Alper Turhan, Murat Erçelik, Ozan Arslan Metallurgical and Materials Engineering Dokuz Eylül University Scanning Electron Microscope SEM Images Resolution and Contrast Enhancement Basic SEM Operating Principles ,[object Object],[object Object],[object Object],[object Object],[object Object],[object Object],[object Object],[object Object],[object Object],[object Object],[object Object],[object Object],[object Object],[object Object],[object Object],[object Object],Fig. 4:BE image (acceleration voltage 25 kV) of a plane section showing strong material contrast between the tungsten carbide (light) and the cobalt binder phase (black). Fig. 5 : SE image of the fracture surface in a fracture toughness test specimen; strong topographic contrast. Fig. 6 : X- Ray Maps Fig.7 : Carbon Nanotubes References 1) ASM Handbook Volume 9 Metallography and Microstructure p 131-149 2) Jeffery B. Bindell AT and T Laboratories Allentown ,Pa ,Advanced Materials & Processes p 20-30 3) David C. Bell Center for Imaging and Mesoscale Structures Fig.1 : Scanning Electron Microscope Fig. 2 : Basic Design of the Scanning Electron Microscope Fig. 3 : Types of electron-beam-excited electrons and radiation used in SEM and the depth of the region below the specimen surface from which information is obtained. Table 1. Physical effects producing radiation, detector types, and detected signals used for imaging and analyzing metal surfaces in the scanning electron microscope](https://image.slidesharecdn.com/semposter-100111213022-phpapp01/85/Sem-Poster-1-320.jpg)
