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Low cost              New technology                                   High performance




                                                                     TM

Cogent ATE
       A3050
            The A3050 delivers up to 512 digital channels in a zero footprint
            system entirely contained within a test head. Its high-throughput
            parallel testing capabilities up to 16 devices.

            The A3050 offers a suite of options to address the variety of testing
            needs in the low-end and mid-range semiconductor markets,
            including the Converter Test Option, Memory Test Option,
            Mixed-Signal Option. Its small footprint and high parallel test
            throughput provide the most economical approach to testing
            complex VLSI devices with embedded memory and analog cells.
Cogent ATE Series
              Leopard
applications           summary

    Logic
✱                      The A3050 delivers up to 512 digital channels in a zero footprint system entirely contained
                       within a test head. Its high-throughput parallel testing capabilities up to 16 devices.
    Memory
✱
                       specications
    FPGA
✱
                          Digital I/O Channels                     512 Max, 32Channels/Board
    Consumer soc
✱
                          Parallel Test Site                       16
    Microcontrollers
✱                         Data Rate                                50MHz
                          Clock Rate                               100MHz
    ASIC
✱
                          Timing Generators                        6 edge/Pin
                          Edge Placement Res.                      1nS
                          Pattern Memory Depth                     4M
                          Strobe Mode                              Edge/Windows
                          Pin Electronics Driver                   -2.0V~+7.0V
                          Rise/Fall                                2.8nS/3V
                          Min Pulse Width                          4nS/5V
                          Pin Electronics                          -2.0V~+11.0V
                          Comparator
                          Utility Relay                            64
                          Format                                   NRZ/RZ/RO/XOR/INVNRZ/INVRZ/INVRO/INVXOR
                          APG                                      X-GEN16bits, Y-GEN 16bits, D-GEN 16bits
                          PMU                                      PPMU,BPMU
                          DPS                                      16
                                                                   DPS Device Power Supply
                                                                   HDVI High density VI Source
                          OPTIONS                                  MT Memory Test Option
                                                                   APMU Analog Pin Measuerment Unit
                                                                   ADT Converter Test Option

                                                                                                 *All specifications subject to change without notice.




                                    CogentATE Systems Corporation
                                    Room 705,SOHO Shangdu North Tower B
                                    No.8 Dongdaqiao Road,Chaoyang District
                                    Beijing 100020, P.R.China
                                    Tel: +86(10)59000102            |    Fax: +86(10)58850677


                                    World Wide Web                  |     www.CogentATE.com

                                    CogentATE is a registered trademark; the CogentATE logo and Leopard Series are trademarks of CogentATE Systems Corporation.
                                    All other trademarks are the property of their respective owners.
                                    © 2008 CogentATE Systems Corporation. All rights reserved.

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A3050 Eng

  • 1. Low cost  New technology High performance TM Cogent ATE A3050 The A3050 delivers up to 512 digital channels in a zero footprint system entirely contained within a test head. Its high-throughput parallel testing capabilities up to 16 devices. The A3050 offers a suite of options to address the variety of testing needs in the low-end and mid-range semiconductor markets, including the Converter Test Option, Memory Test Option, Mixed-Signal Option. Its small footprint and high parallel test throughput provide the most economical approach to testing complex VLSI devices with embedded memory and analog cells.
  • 2. Cogent ATE Series Leopard applications summary Logic ✱ The A3050 delivers up to 512 digital channels in a zero footprint system entirely contained within a test head. Its high-throughput parallel testing capabilities up to 16 devices. Memory ✱ specications FPGA ✱ Digital I/O Channels 512 Max, 32Channels/Board Consumer soc ✱ Parallel Test Site 16 Microcontrollers ✱ Data Rate 50MHz Clock Rate 100MHz ASIC ✱ Timing Generators 6 edge/Pin Edge Placement Res. 1nS Pattern Memory Depth 4M Strobe Mode Edge/Windows Pin Electronics Driver -2.0V~+7.0V Rise/Fall 2.8nS/3V Min Pulse Width 4nS/5V Pin Electronics -2.0V~+11.0V Comparator Utility Relay 64 Format NRZ/RZ/RO/XOR/INVNRZ/INVRZ/INVRO/INVXOR APG X-GEN16bits, Y-GEN 16bits, D-GEN 16bits PMU PPMU,BPMU DPS 16 DPS Device Power Supply HDVI High density VI Source OPTIONS MT Memory Test Option APMU Analog Pin Measuerment Unit ADT Converter Test Option *All specifications subject to change without notice. CogentATE Systems Corporation Room 705,SOHO Shangdu North Tower B No.8 Dongdaqiao Road,Chaoyang District Beijing 100020, P.R.China Tel: +86(10)59000102 | Fax: +86(10)58850677 World Wide Web | www.CogentATE.com CogentATE is a registered trademark; the CogentATE logo and Leopard Series are trademarks of CogentATE Systems Corporation. All other trademarks are the property of their respective owners. © 2008 CogentATE Systems Corporation. All rights reserved.