Atomic Layer Deposition solutions for SiC Power Electronics
Beneq provides Atomic Layer Deposition (ALD) equipment and materials for applications such as SiC MOSFETs. The presentation discusses the growing market for SiC power devices and how ALD can provide conformal thin films for gate dielectrics and surface passivation layers. Beneq's Transform batch ALD system enables both plasma-enhanced and thermal ALD processing for deposition of interfacial layers and thicker dielectric stacks. The Transform system offers high throughput and versatility for manufacturing of power electronics.
Atomic Layer Deposition solutions for SiC Power Electronics
1. Atomic Layer Deposition solutions
for SiC Power Electronics
Integrated ALD passivation/gate dielectric
stack for SiC MOSFET
Mikko Söderlund – Semiconductor Business Unit
April 19, 2023
2. 17.4.2023 – CONFIDENTIAL
Company Introduction and More-than-Moore market focus
Semiconductor ALD solutions and materials for SiC power devices
Inflection in passivation/gate dielectric
Introduction to ALD equipment
Differentiated Beneq Transform® ALD cluster tool
Outline
3. 17.4.2023 – CONFIDENTIAL
Semiconductor ALD products
Beneq Transform® and C2
for the up to 200 mm MtM market
Beneq Transform® 300 & C3
for the 300 mm MtM market
Beneq Prodigy™
for Compound Semi
and MEMS markets
200 mm and smaller wafers 300 mm wafers
Prodigy™ Transform®
Transform® Lite Transform® 300
4. 17.4.2023
Semiconductor Markets we serve
Power devices
Image sensors
R&D
µOLED
Advanced packaging
RF Ics, Filters
More-than-Moore device fabrication:
✓ Power devices
✓ RF Filter devices
✓ RF ICs
✓ CMOS image sensors
✓ µOLED
✓ LED, µLED, EEL, VCSEL, detectors and Si photonics
✓ MEMS, sensors and actuators
✓ Advanced Packaging (TSV, CSP)
✓ Smart Power
✓ Microcontroller and e-NVM
✓ RF, Analog and mixed signal
17.4.2023 – CONFIDENTIAL
300 mm
*
This presentation
5. 17.4.2023 – CONFIDENTIAL
BENEQ ALD Solutions for Power Devices
Market
segments
Gate Dielectric
(SiO2, High-k)
Surface
passivation
Nucleation &
seed, doping
Metal & TCO Final Passivation
(moisture
barrier)
Trench MOSFET
✓ ✓ ✓
SJ MOSFET
✓ ✓ ✓
IGBT
✓ ✓ ✓
SiC MOSFET &
Trench MOSFET ✓ ✓ ✓ ✓
GaN HEMT
✓ ✓ ✓ ✓ ✓
Vertical GaN
✓ ✓ ✓ ✓
Plasma enhanced single wafer and/or sequential PEALD + thermal batch processing
12. Materials & process solutions for SiC MOSFET
17.4.2023 – CONFIDENTIAL
✓ Optional** PEALD Nitride interfacial layer (AlN or Si3N4)
• Further passivation of the SiC surface by nitridation
• Effectively blocks oxygen to the SiC surface, leading to reduced Dit
✓ Deposition of gate dielectric (SiO2, High-k or SiO2/High-k)
• Provide necessary performance as gate dielectric
• High-k to improve reliability of the gate dielectric
• Al2O3 or SiO2 acts as a capping material to prevent oxidation of the surface
✓ In-situ* plasma preclean to remove surface damage and/or provide surface
nitridation of the surface
• Remove cristal disorder at the surface SiC, Carbon clusters, caused by oxidation of SiC
• Nitridation for passivation of SiC surface
• Provide high quality interface for low density of interface states
T. Kimoto et al. IEDM 2021
* In-situ to the PEALD process module
** alternative to NO Anneal
13. Transform® Batch ALD performance – SiO2
Performance Value
Breakdown (MV/cm) > 9.5
Leakage current density, @
5 MV/cm (A/cm2)
~ 1 x 10-8
Refractive index @ 633 nm 1.45
Density (g/cm3) 2
Current vs. Electric Field
Process temperature 300°C
Wafer size 200mm
WiW: ~ 0.6%, 1σ
Wt: ~ 0.2%, 1σ
BtB: ~ 0.26%, 1σ
Throughput: 12 WPH @50 nm
Pre-clean/treat and PEALD SiN is available on the single wafer plasma module
17.4.2023 – CONFIDENTIAL
25-wafer batch
ToF-ERDA profile of thermal SiO2
As deposited thermal SiO2
O: 61.0 ± 0.6 at-%
Si: 29.6 ± 0.5 at-%
H: 9.4 ± 0.6 at-%
C: <0.2 at-%
(As deposited PEALD SiO2)
O: 62.8 ± 0.6 at-%
Si: 31.3 ± 0.5 at-%
H: 5.8 ± 0.5 at-%
C: <0.2 at-%
14. SiO2 ALD / anneal integration - current status
17.4.2023 – CONFIDENTIAL
Before annealing After annealing
• Low hysteresis and fixed charges are obtained after anneal for both thermal and plasma ALD SiO2
• Plasma ALD SiO2 better control of the interface/trapped charges and will benefit of in-situ plasma pre-clean technology
16. 17/04/2023
• Highly versatile cluster platform supporting a wide
range of material and applications
• Breakthrough in throughput with pre-heating and
flow optimized mini-batch reactor design
• Differentiated & patented sequential ALD processing
combining plasma enhanced and thermal batch ALD
for “best of both” worlds capability
• Beneq Transform has become 1st choice for Tier1
IDM’s, Foundries and RTOs in Power, RF,
MicroLED/Photonics, CIS, MEMS and Advanced
Packaging
Introducing Beneq Transform ®
Beneq
Confidential
Versatile platform dedicated to More-than-Moore device fabrication
Beneq Transform is your engine for the SiC materials revolution!
18. to customers’ developing needs.
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To fulfill our mission, we:
www.beneq.com |
info@beneq.com | +358 9 7599 530
mikko.soderlund@beneq.com
Beneq is the home of atomic layer
deposition. In 1984, we established the
world’s first industrial production using
ALD. Today, we lead the market with
products for R&D (TFS 200, TFS 500, R2),
semiconductor device fabrication
(Transform®, Transform® 300, and
ProdigyTM), 3D and batch production
(P400A, P800, P1500), ultra-fast spatial
ALD (C2R), and roll-to-roll ALD (Genesis).