SPICE MODEL of C4D40120D LTspice Model (Professional Model) in SPICE PARK. English Version is http://www.spicepark.net. Japanese Version is http://www.spicepark.com by Bee Technologies.

1. Device Modeling Report
COMPONENTS: Silicon Carbide Schottky Diode
PART NUMBER: C4D40120D
MANUFACTURER: CREE
REMARK: Professional Model
Bee Technologies Inc.
All Rights Reserved Copyright (C) Bee Technologies Inc. 2011
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2. DIODE MODEL PARAMETERS
Spice model
Model description
parameter
IS Saturation Current
N Emission Coefficient
RS Series Resistance
IKF High-injection Knee Current
CJO Zero-bias Junction Capacitance
M Junction Grading Coefficient
VJ Junction Potential
ISR Recombination Current Saturation Value
BV Reverse Breakdown Voltage(a positive value)
IBV Reverse Breakdown Current(a positive value)
TT Transit Time
EG Energy-band Gap
All Rights Reserved Copyright (C) Bee Technologies Inc. 2011
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3. Forward Current Characteristics
Circuit Simulation result
Evaluation circuit
All Rights Reserved Copyright (C) Bee Technologies Inc. 2011
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4. Comparison Graph
Circuit Simulation result
Comparison table
VF (V)
IF (A) %Error
Measurement Simulation
0.1 0.750 0.768 2.40
0.2 0.820 0.806 -1.71
0.5 0.860 0.861 0.12
1 0.925 0.910 -1.62
2 0.975 0.974 -0.10
5 1.100 1.106 0.55
10 1.285 1.283 -0.16
20 1.589 1.603 0.88
40 2.215 2.208 -0.32
All Rights Reserved Copyright (C) Bee Technologies Inc. 2011
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5. Reverse Current Characteristic
Circuit Simulation result
Evaluation circuit
All Rights Reserved Copyright (C) Bee Technologies Inc. 2011
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6. Comparison Graph
Circuit Simulation result
Comparison table
IR (mA)
VR (V) %Error
Measurement Simulation
1250 4.00E-03 3.900E-03 -2.50
1350 1.47E-02 1.400E-02 -4.76
1450 5.24E-02 5.000E-02 -4.58
1550 1.71E-01 1.790E-01 4.86
1555 1.00E+00 1.00E+00 0.00
All Rights Reserved Copyright (C) Bee Technologies Inc. 2011
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7. Total Capacitance Characteristics
Circuit Simulation result
Evaluation circuit
All Rights Reserved Copyright (C) Bee Technologies Inc. 2011
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8. Comparison Graph
Circuit Simulation result
Comparison table
CT (pF)
VR (V) %Error
Measurement Simulation
0.2 1445.000 1448.000 0.21
0.5 1310.000 1313.000 0.23
1 1150.000 1154.100 0.36
2 950.000 959.127 0.96
5 700.000 694.823 -0.74
10 530.000 522.351 -1.44
20 385.000 384.447 -0.14
50 255.000 251.905 -1.21
100 180.000 181.873 1.04
200 125.000 131.017 4.81
500 82.000 84.780 3.39
1000 59.000 61.201 3.73
All Rights Reserved Copyright (C) Bee Technologies Inc. 2011
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