My presentation for the panel atthe 9th International Design and Test Symposium

1. Confidential © ams AG 2014
Looking to the next 5 years?
Analogue Test
9th IEEE International Design and
Test Symposium
Peter Sarson CEng MIET CMgr MCMI
Full Service Foundry
16th – 18th December 2014

2. Confidential © ams AG 2014
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Automotive Test
Existing Challenges that your domain is facing today?
Historically Low Volume, High Reliability
More and more extensive and exhaustive testing
• Very long test times
• Limited resources needed extensively around the device
 Potentially compromising the loadboard design
• Long time to market
Expensive RMA process
• Extensive failures analysis
• 8D reports

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Consumer Test
Existing Challenges that your domain is facing today?
High Volume
Bare bones testing, system tests
• Short test times
• Complicated multisite boards, high parallelism
 Long down times due to setup issues during production
• Fast time to market
Non existent RMA flow
• Generally only receive RMA during cost negotiations

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Automotive test
Future Challenges you think your domain will face in the coming 5 years?
A move to higher supply voltages, more complex test boards
• Fewer resources available and lower accuracy
• Requires more and more resource sharing
Higher volume
An even larger focus on product quality and reliability
• As devices get larger and more complex – many more missed defects
in the test process

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Consumer
Future Challenges you think your domain will face in the coming 5 years?
Our current high volume consumer customers are requesting more
automotive style product qualifications
More precision
• Less chance for parallelism, higher cost
More RMA received
Even higher volume
• Need more parallelism

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Automotive and Consumer
Future Challenges you think your domain will face in the coming 5 years?
My opinion
• Automotive and consumer requirements will merge and a single
standard will be adopted for all semiconductor segments
• Larger ASICS, smaller geometries, more defects per sqmm
 More focus on defect based testing rather than spec testing as this
simply doesn’t find the real defects.
• We will need more design tools to calculate analogue test coverage and
show where the test coverage is missing

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Automotive and Consumer
Future Challenges you think your domain will face in the coming 5 years?
• We will need to focus more on automated analogue DFT to allow to
mux signals internally to a device and to single points on loadboards
 To Aid test board reliability, device debugability, Auto test insertion,
better accuracy

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Software
What do you suggest as role for developing countries in this overall industry?
• Software can be literally developed anywhere
• No need for large fabs, investment etc
• Developing countries have good Universities and academic
establishments
• My suggestion would be to tap into this knowledge and have developing
countries work with industry and IEEE standard bodies to develop tools
for the EDA an test communities

9. Confidential © ams AG 2014
Thank you
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