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Rifle-m
1. RIFLE-M
device analysis platform
• Speeds up new product introduction
• Reduces engineering effort in test development
• Improves cost of ownership
2. Technologies
o NAND, NOR
o PCM, NROM
o RRAM, FeRAM, MRAM
o Embedded
o SLC / MLC / 3D
Areas
o Technology development
o Design validation
o Characterization
o Reliability analysis
o Failure analysis
Interfaces
o Parallel, multiplexed
o Serial
o JTAG
o Custom
Devices
o Single cell, test array
o Stand-alone memory
o SOC, uC
o Smart card
Applications
3. Fast Time-to-Result
o Single environment for
development, execution
and analysis
o True interactive testing
Analog Performance
o 200 MHz arbitrary waveform
generators
o 1 MHz PMU for fast cell
current measurement
o Full synchronization
Easy Installation
o Small-footprint desktop
o No need of lab
o Thermostream / EMMI
o Package and wafer tests
Software-Based Testing
o Increased visibility through
algorithmic device
management
o Programmable
communication protocol
Highlights
4. Integrated Software Environment
Execution
Analysis
Development
• Microsoft Visual Studio
• Productivity significantly
higher than ATE
• Protocol description:
• C++
• Dedicated FPGA IP
• Device algorithms:
• C++
• Strong library support
• Test flows:
• C++
• NTEE Operating system
• Local and remote control
• Engineering and operator
modes
• On-the-fly consultation of
the test results (plots,
numeric)
• On-line
• Sent to BARNIE via
TCP-IP
• Automated and
manual processing
• Off-line
• XML or STDF
• Conform to NplusT
test data model
• Loaded in
BarnieDAC or in third-
party tool
5. List of Functions
The following list of functions is device and
implementation dependent
Memory Test
Program
Erase
Verify
Read
Cycling
Vt Analyis
Bitmap
Distribution
Edge lookup
Icell Analysis
Bitmap
Distribution
IV
Stress
Read stress
Wordline and
bitline disturb
Miscellaneous
Continuity
check
Icc
Iref
Device ID
Vbandgap
6. NplusT
would like to thank you
for your time and consideration
for further information: info@n-plus-t.com