semiconductor testing semiconductor data yieldwerx manufacturing yield semiconductor part average test statistical bin analysis semiconductor production proce semiconductor manufacturing yield management systems wafer testing chip production wafer manufacturing silicon wafer manufacturing wafer fabrication outlier detection test big data analytics root cause analysis in semicon root cause analysis spat semiconductor statistical yield limit yield improvement tools semiconductor industry good die bad neighborhood pat static pat dynamic pat reduce manufacturing costs lot identification wafer maps manufacturingyield semiconuctordata outlierdetection reducemanufacturingcosts semiconductormanufacturingproc waferfabrication semiconductorproduction defect root cause types yield enhancement systems spc/sbl/syl production yield reporting smart wafer merge executive dashboard yield management system semiconductor yield outlier detection rca yield analytics statistical bin limit spc semiconductor yms solutions dynamic part average test semiconductors semiconductor device semiconductor devices manufacturing
Ver mais