Personal Information
Setor
Technology / Software / Internet
Site
yieldwerx.com/
Sobre
yieldWerx offers end-to-end semiconductor test data analytics solutions in a modular framework so that customers can purchase the capability needed to support their current business.
Marcadores
semiconductor testing
semiconductor data
yieldwerx
manufacturing yield
semiconductor
part average test
statistical bin analysis
semiconductor production proce
semiconductor manufacturing
yield management systems
wafer testing
chip production
wafer manufacturing
silicon wafer manufacturing
wafer fabrication
outlier detection test
big data analytics
root cause analysis in semicon
root cause analysis
spat semiconductor
statistical yield limit
yield improvement tools
semiconductor industry
good die bad neighborhood
pat
static pat
dynamic pat
reduce manufacturing costs
lot identification
wafer maps
manufacturingyield
semiconuctordata
outlierdetection
reducemanufacturingcosts
semiconductormanufacturingproc
waferfabrication
semiconductorproduction
defect root cause types
yield enhancement systems
spc/sbl/syl
production yield reporting
smart wafer merge
executive dashboard
yield management system
semiconductor yield
outlier detection
rca
yield analytics
statistical bin limit
spc semiconductor
yms solutions
dynamic part average test
semiconductors
semiconductor device
semiconductor devices
manufacturing
Ver mais
Apresentações
(10)Personal Information
Setor
Technology / Software / Internet
Site
yieldwerx.com/
Sobre
yieldWerx offers end-to-end semiconductor test data analytics solutions in a modular framework so that customers can purchase the capability needed to support their current business.
Marcadores
semiconductor testing
semiconductor data
yieldwerx
manufacturing yield
semiconductor
part average test
statistical bin analysis
semiconductor production proce
semiconductor manufacturing
yield management systems
wafer testing
chip production
wafer manufacturing
silicon wafer manufacturing
wafer fabrication
outlier detection test
big data analytics
root cause analysis in semicon
root cause analysis
spat semiconductor
statistical yield limit
yield improvement tools
semiconductor industry
good die bad neighborhood
pat
static pat
dynamic pat
reduce manufacturing costs
lot identification
wafer maps
manufacturingyield
semiconuctordata
outlierdetection
reducemanufacturingcosts
semiconductormanufacturingproc
waferfabrication
semiconductorproduction
defect root cause types
yield enhancement systems
spc/sbl/syl
production yield reporting
smart wafer merge
executive dashboard
yield management system
semiconductor yield
outlier detection
rca
yield analytics
statistical bin limit
spc semiconductor
yms solutions
dynamic part average test
semiconductors
semiconductor device
semiconductor devices
manufacturing
Ver mais