Personal Information
Organização/Local de trabalho
Jonesboro, Arkansas Area United States
Setor
Education
Sobre
- Investigating optoelectronic properties of semiconductor materials (CdTe, In2S3, CuInS2) deposited by different deposition techniques, such as electroplating (ED), physical vapor deposition (PVD), chemical bath deposition (CBD), electron beam evaporation (EB), sputtering, successive ionic layer atomic reaction (SILAR), etc.
- Characterizing the optical, structural, crystallographic, electrical, compositional, and thermal properties of the deposited semiconductors using, UV-VIS spectrophotometer, scanning electron microscope (SEM), transmission electron microscope (TEM), atomic force microscope (AFM), X-ray diffraction (XRD), energy dispersive spectroscopy (EDS), profilometer, photoelec...
Marcadores
electrodeposition
solar cells
indium (iii) sulfide
thin film semiconductor
buffer layer
photovoltaics
taguchi method
organic electrolyte
cracks
copper indium disulfide
buffer layers
indium sulfide
semiconductor
solar cell
hydrogen
photoelectrochemical
characterization
energy conversion
energy
photoelectrolysis
renewable energy
titanium
photoanode
process optimization
deposition technique
deposition techniques
thin film solar cells
energy efficiency
interface properties
cdte
cigs
cis
orthogonal regression analysis
optimization technique
design of experiment
fracture and buckling analysis
digital image processing
porous zones
substrate
morphology
stress
strain
molybdenum
cyclic voltammogram
quasi rest potential
thin film
in2s3
s/n ratio
semiconductors
Ver mais
Apresentações
(5)Documentos
(7)Personal Information
Organização/Local de trabalho
Jonesboro, Arkansas Area United States
Setor
Education
Sobre
- Investigating optoelectronic properties of semiconductor materials (CdTe, In2S3, CuInS2) deposited by different deposition techniques, such as electroplating (ED), physical vapor deposition (PVD), chemical bath deposition (CBD), electron beam evaporation (EB), sputtering, successive ionic layer atomic reaction (SILAR), etc.
- Characterizing the optical, structural, crystallographic, electrical, compositional, and thermal properties of the deposited semiconductors using, UV-VIS spectrophotometer, scanning electron microscope (SEM), transmission electron microscope (TEM), atomic force microscope (AFM), X-ray diffraction (XRD), energy dispersive spectroscopy (EDS), profilometer, photoelec...
Marcadores
electrodeposition
solar cells
indium (iii) sulfide
thin film semiconductor
buffer layer
photovoltaics
taguchi method
organic electrolyte
cracks
copper indium disulfide
buffer layers
indium sulfide
semiconductor
solar cell
hydrogen
photoelectrochemical
characterization
energy conversion
energy
photoelectrolysis
renewable energy
titanium
photoanode
process optimization
deposition technique
deposition techniques
thin film solar cells
energy efficiency
interface properties
cdte
cigs
cis
orthogonal regression analysis
optimization technique
design of experiment
fracture and buckling analysis
digital image processing
porous zones
substrate
morphology
stress
strain
molybdenum
cyclic voltammogram
quasi rest potential
thin film
in2s3
s/n ratio
semiconductors
Ver mais