SPICE MODEL of SPD02N60C3 (Professional+BDSP Model) in SPICE PARK. English Version is http://www.spicepark.net. Japanese Version is http://www.spicepark.com by Bee Technologies.
1. Device Modeling Report
COMPONENTS: Power MOSFET (Professional)
PART NUMBER: SPD02N60C3
MANUFACTURER: Infineon technologies
REMARK: Body Diode (Special)
Bee Technologies Inc.
All Rights Reserved Copyright (c) Bee Technologies Inc. 2005
2. POWER MOSFET MODEL
Pspice model
Model description
parameter
LEVEL
L Channel Length
W Channel Width
KP Transconductance
RS Source Ohmic Resistance
RD Ohmic Drain Resistance
VTO Zero-bias Threshold Voltage
RDS Drain-Source Shunt Resistance
TOX Gate Oxide Thickness
CGSO Zero-bias Gate-Source Capacitance
CGDO Zero-bias Gate-Drain Capacitance
CBD Zero-bias Bulk-Drain Junction Capacitance
MJ Bulk Junction Grading Coefficient
PB Bulk Junction Potential
FC Bulk Junction Forward-bias Capacitance Coefficient
RG Gate Ohmic Resistance
IS Bulk Junction Saturation Current
N Bulk Junction Emission Coefficient
RB Bulk Series Resistance
PHI Surface Inversion Potential
GAMMA Body-effect Parameter
DELTA Width effect on Threshold Voltage
ETA Static Feedback on Threshold Voltage
THETA Modility Modulation
KAPPA Saturation Field Factor
VMAX Maximum Drift Velocity of Carriers
XJ Metallurgical Junction Depth
UO Surface Mobility
All Rights Reserved Copyright (c) Bee Technologies Inc. 2005
3. Body Diode Model
Pspice model
Model description
parameter
IS Saturation Current
N Emission Coefficient
RS Series Resistance
IKF High-injection Knee Current
CJO Zero-bias Junction Capacitance
M Junction Grading Coefficient
VJ Junction Potential
ISR Recombination Current Saturation Value
BV Reverse Breakdown Voltage(a positive value)
IBV Reverse Breakdown Current(a positive value)
TT Transit Time
All Rights Reserved Copyright (c) Bee Technologies Inc. 2005
4. Transconductance Characteristic
Circuit Simulation Result
Comparison table
gfs (S)
ID(A) Error (%)
Measurement Simulation
0.2 0.675 0.685 1.48
0.5 1.1 1.08 -1.82
1 1.53 1.52 -0.65
2 2.1 2.1275 1.31
All Rights Reserved Copyright (c) Bee Technologies Inc. 2005
5. Vgs-Id Characteristic
Circuit Simulation result
2.0A
1.0A
0A
0V 5V 10V
I(V2)
V_V1
Evaluation circuit
V2
0V dc
U1 V3
V1SP D0 2N6 0C3P_ DS P
10 Vd c
10 .0Vd c
0
All Rights Reserved Copyright (c) Bee Technologies Inc. 2005
6. Comparison Graph
Circuit Simulation Result
Simulation Result
VGS(V)
ID(A) Error (%)
Measurement Simulation
0.2 3.945 3.9604 0.39
0.5 4.295 4.3003 0.123
1 4.675 4.6851 0.216
2 5.24 5.2322 -0.149
All Rights Reserved Copyright (c) Bee Technologies Inc. 2005
7. Id-Rds(on) Characteristic
Circuit Simulation result
2.0A
1.0A
0A
0V 2.5V 5.0V
I(V2)
V_V3
Evaluation circuit
V2
0Vdc
U1 V3
V1SPD02N60C3P_DSP
10Vdc
10.0Vdc
0
Simulation Result
ID=1.1, VGS=10V Measurement Simulation Error (%)
R DS (on) 2.291 2.2911 0.004
All Rights Reserved Copyright (c) Bee Technologies Inc. 2005