surface and materials analysis techniques for nanoeducation

1. Surface and Materials Analysis Techniques Nanotechnology Foothill College

10. XPS/AES Analysis Volume

12. Why the Odd Name?

14. Auger Data Formats Raw Data Differentiated Data

15. Auger Instrumentation PHI Model 660 Scanning Auger Microprobe

16. Sputtering (Ion Etching) of Samples

17. Al/Pd/GaN Thin Film Example (cross section)

18. Al/Pd/GaN Profile Data

19. Al/Pd/GaN Atomic Concentration Data

21. What is XPS / ESCA? X-ray Photoelectron Spectroscopy (XPS), also known as Electron Spectroscopy for Chemical Analysis (ESCA) is a widely used technique to investigate the chemical composition of surfaces.

22. X-ray Photoelectron Spectroscopy Small Area Detection X-ray Beam X-ray penetration depth ~1  m. Electrons can be excited in this entire volume. X-ray excitation area ~1x1 cm 2 . Electrons are emitted from this entire area Electrons are extracted only from a narrow solid angle. 1 mm 2 10 nm

25. Surface Analysis Tools SSX-100 ESCA on the left, Auger Spectrometer on the right

28. Surface Treatment of NiTi Biomedical Devices and Biomedical Implants – SJSU Guna Selvaduray

29. Surface Treatment of NiTi Biomedical Devices and Biomedical Implants – SJSU Guna Selvaduray

34. The Self-Assembly Process The self-assembly process. An n -alkane thiol is added to an ethanol solution (0.001 M). A gold (111) surface is immersed in the solution and the self-assembled structure rapidly evolves. A properly assembled monolayer on gold (111) typically exhibits a lattice. A schematic of SAM ( n -alkanethiol CH 3 (CH 2 ) n SH molecules) formation on a Au(111) sample.

37. SAMs C10 Imaging with AFM http://sibener-group.uchicago.edu/has/sam2.html

42. AFM Instrumentation PNI Nano-R AFM Instrumentation as used at Foothill College

44. A Family of Microscopes AFM SPM (air, liquid, vacuum) STM Topography Spectroscopy Lithography EChem. BEEM SNOM(NSOM) Aperture Aperatureless Reflection Transmission Contact Modes Topography LFM, SThM Lithography AC Modes Topography MFM, EFM SKPM Others EChem

47. AFM Stage Assembly AFM Stage for sample orientation, with scanner and optics Z Motion Control xyz scanner XY Motion Control AFM Force Sensor Optic

48. AFM Light Lever – Force Sensor Signal out Sample When the cantilever moves up and down, the position of the laser on the photo detector moves up and down. Differential Amplifier

49. High Resolution Video Microscope Scanner Sample Puck X-Y Stage (in granite block) Light Lever Crystal Nano-R™ Stage

50. High Resolution Video Microscope Software control of video microscope functions Optical Microscope

51. Easy Sample Load Load and Unload Sample Positions Sample Puck

52. Video Optical Microscope Laser Alignment Feature Location

53. Information Technology – DVD

54. Consumer – Razor Blade Cutting edge of razor blade 4 X 4 µ

55. Consumer Applications 100 X 100 µ AFM is used to understand the glossing characteristics of paper surfaces

58. NanoMechanics- MEMS

62. SEM Principles of Operation http://mse.iastate.edu/microscopy/beaminteractions.html

63. http://mse.iastate.edu/microscopy/proimage.html SEM Principles of Operation

65. SEM Instrument

66. SEM – AFM Comparison SEM AFM Wide range of sample roughness True 3D image Operated in low to high vacuum Vacuum, Air or Liquid