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Device Modeling Report




COMPONENTS:THYRISTOR
PART NUMBER:3P6MH
MANUFACTURER: NEC




                 Bee Technologies Inc.


  All Rights Reserved Copyright (c) Bee Technologies Inc. 2005
DIODE MODEL
 Pspice model
                                        Model description
  Parameter
       IS         Saturation Current
       N          Emission Coefficient
      RS          Series Resistance
      IKF         High-injection Knee Current
     CJO          Zero-bias Junction Capacitance
       M          Junction Grading Coefficient
       VJ         Junction Potential
     ISR          Recombination Current Saturation Value
      BV          Reverse Breakdown Voltage(a positive value)
     IBV          Reverse Breakdown Current(a positive value)
       TT         Transit Time




          All Rights Reserved Copyright (c) Bee Technologies Inc. 2005
IG-VT Characteristic

Evaluation Circuit




Simulation result




                                                           Simulation




Comparison Table
                         Measurement              Simulation             % Error
        IGT (mA)           0.2(max)                0.197584              1.2080
         VGT (V)           0.8(max)                0.786130              1.7338

               All Rights Reserved Copyright (c) Bee Technologies Inc. 2005
ITM-VTM Characteristic

Evaluation Circuit




Simulation result




                                                         Simulation




Comparison Table
         At ITM=10A         Measurement             Simulation           % Error
          VTM(V)              1.6(max)                1.5522             2.9875


               All Rights Reserved Copyright (c) Bee Technologies Inc. 2005
Holding Characteristic (IH)

Evaluation Circuit




Simulation result




                                                          Simulation




Comparison Table
       VDM=24V,ITM=10A      Measurement            Simulation          % Error
           IH(mA)             5(max)                 4.9663            0.6740

               All Rights Reserved Copyright (c) Bee Technologies Inc. 2005
Switching Time Characteristic

Evaluation Circuit




Simulation result




                                                  Simulation




Comparison Table
                         Measurement             Simulation             %Error
        Toff(us)             80                    80.670               -0.8375


               All Rights Reserved Copyright (c) Bee Technologies Inc. 2005

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SPICE MODEL of 3P6MH in SPICE PARK

  • 1. Device Modeling Report COMPONENTS:THYRISTOR PART NUMBER:3P6MH MANUFACTURER: NEC Bee Technologies Inc. All Rights Reserved Copyright (c) Bee Technologies Inc. 2005
  • 2. DIODE MODEL Pspice model Model description Parameter IS Saturation Current N Emission Coefficient RS Series Resistance IKF High-injection Knee Current CJO Zero-bias Junction Capacitance M Junction Grading Coefficient VJ Junction Potential ISR Recombination Current Saturation Value BV Reverse Breakdown Voltage(a positive value) IBV Reverse Breakdown Current(a positive value) TT Transit Time All Rights Reserved Copyright (c) Bee Technologies Inc. 2005
  • 3. IG-VT Characteristic Evaluation Circuit Simulation result Simulation Comparison Table Measurement Simulation % Error IGT (mA) 0.2(max) 0.197584 1.2080 VGT (V) 0.8(max) 0.786130 1.7338 All Rights Reserved Copyright (c) Bee Technologies Inc. 2005
  • 4. ITM-VTM Characteristic Evaluation Circuit Simulation result Simulation Comparison Table At ITM=10A Measurement Simulation % Error VTM(V) 1.6(max) 1.5522 2.9875 All Rights Reserved Copyright (c) Bee Technologies Inc. 2005
  • 5. Holding Characteristic (IH) Evaluation Circuit Simulation result Simulation Comparison Table VDM=24V,ITM=10A Measurement Simulation % Error IH(mA) 5(max) 4.9663 0.6740 All Rights Reserved Copyright (c) Bee Technologies Inc. 2005
  • 6. Switching Time Characteristic Evaluation Circuit Simulation result Simulation Comparison Table Measurement Simulation %Error Toff(us) 80 80.670 -0.8375 All Rights Reserved Copyright (c) Bee Technologies Inc. 2005