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MIPI Alliance conformance test suites provide a valuable set of tools improving interoperability of MIPI specification-based products. While the main purpose of conformance test suites is to verify conformance of these products at post-silicon stages, a significant number of these tests can be used in pre-silicon verification of MIPI-based designs in order to improve the product quality and increase confidence for being spec-conformant in very early design stage. This presentation by Ofir Michaeli of Cadence Design Systems focuses on the following topics: selection of appropriate CTS tests for pre-silicon verification, integrating CTS tests into the verification plan, and modification of the verification test bench to accommodate CTS tests. These topics are explained by the examples of integration of DSI, D-PHY and C-PHY conformance test suites into verification plans and would be relevant for every engineer who designs or verifies MIPI-based interfaces.