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International Journal of Science and Engineering Applications
Special Issue NCRTAM ISSN-2319-7560 (Online)
www.ijsea.com 35
Growth, structural, mechanical and dielectric studies of
undoped and urea doped L-alaninium maleate
(LAM) crystals
M. Krishnasamy
Department of physics,
S.T.Hindu college,
Nagercoil, India.
S.Subramanian,
Department of physics,
The M.D.T.Hindu College,
Tirunelveli.,India.
P.Selvarajan.
Department of physics,
Aditanar college of Arts and
Science, Tiruchendur.India
Abstract Undoped and urea doped L-alaninium maleate crystals were grown by solution method with slow evaporation technique.
Solubility studies were carried out for the grown crystals and it is found that solubility increases with temperature for both the samples.
XRD studies were performed to find the crystal structure of the samples. NLO activity of the grown crystals was studied using a
Nd:YAG laser and SHG efficiency was found for both the samples. Microhardness studies were performed to understand the
mechanical strength of the samples. Measurements of values of dielectric constant and dielectric loss were carried out and the
electrical processes that are taking place in the samples are discussed.
Keywords: Amino acid complex; NLO; doping; single crystal; solution growth; spectroscopy; SHG; hardness
1. INTRODUCTION
Nonlinear Optical (NLO) materials have potential
applications in Second Harmonic Generation (SHG), optical
storage, optical communication, photonics, .electro-optic
modulation, optical parametric amplifiers , optical image
processing etc [1,2]. L-alanine is an alpha amino acid with
NLO activity and it has the chemical formula
CH3CHNH2COOH. It is a white odorless crystal powder and
easily dissolves in water, slightly dissolves in alcohol and
undissolves in ether. L-alanine is a conditionally essential
amino acid and it is an important source of energy for muscle
tissue, the brain and central nervous system. L-alanine
strengthens the immune system by producing antibodies,
helps in the metabolism of organic acids and sugars and is
used by protein synthesis and immune system regulation [3,4].
Considering the importance of L-alanine, it is combined with
maleic acid to form L-alaninium maleate (LAM). To improve
the NLO activity and other properties of LAM crystal, urea
was added as the dopant into LAM in this work. The aim of
this work is to report on the growth of undoped and urea
doped LAM crystals and to discuss the results obtained from
various studies such as solubility studies, XRD, hardness
studies, SHG studies and dielectric studies.
2. GROWTH AND SOLUBILITY
L-alaninium maleate (LAM) sample was prepared from
aqueous solutions of AR grade L-alanine and maleic acid
taken in 1:1 molar ratio. The evaporation of the solution
yielded LAM crystals. To obtain urea doped LAM, 1 mole%
of urea was added the solution of LAM. The key factor for
successful growth of any crystal is the proper selection of
solvents. To find out the suitable solvent, the solubility test
was carried out by gravimetrical method [5] and here water
was found to be the suitable solvent for growing crystals. The
solubility of the solute can be determined by dissolving the
solute in the solvent maintained at a constant temperature with
continuous stirring. On reaching saturation, equilibrium
concentration of the solute can be determined. The solubility
curves for undoped and urea doped LAM samples were
plotted and they are shown in figure 1. It is observed that
solubility increases with temperature for both the samples.
When urea was doped into LAM crystal, it is noticed that the
solubility increases leading to dissolution of more solute in
the same amount of solvent.
30 35 40 45 50
24
25
26
27
28
29
30
31
Solubility(g/100ml)
Temperature (
o
C)
Undoped LAM sample
LAM + 1 mole% of urea
Figuere 1. Solubility curves for undoped and urea doped
LAM samples.
3. CHARACTERIZATION OF THE
GROWN CRYSTALS
Single crystal XRD data of undoped and urea doped
LAM crystals were collected from a single crystal X-ray
diffractometer with graphite mono chrormated MoKa
International Journal of Science and Engineering Applications
Special Issue NCRTAM ISSN-2319-7560 (Online)
www.ijsea.com 36
radiation. The obtained crystallographic data for undoped
LAM and urea doped LAM crystals are a=5.572(2) Å , b =
7.415(4) Å, c = 23.674(3) Å , α = β = γ = 90° and a=
o o
o
respectively. From the data, it is observed that both the
grown crystals crystallize in orthorhombic crystal systems.
The number of molecules per unit cell (Z) for both crystals of
this work is found to be 4. The slight changes in the lattice
parameters are due to incorporation of urea in the lattice of
LAM crystal.
The mechanical property of crystals can be analyzed by
carrying out microhardness studies using a Leitz Vickers
microhardness tester. Measuring microhardness gives an idea
about the mechanical strength of a material. The hardness of a
material is a measure of its resistance to plastic deformation.
In an ideal crystal, the hardness value should be independent
of applied load. But in a real crystal, the load dependence is
observed. This is due to normal indentation size effect (ISE).
The hardness number was measured for undoped and urea
doped LAM crystals by applying different loads. The Vickers
microhardness number was calculated using the relation Hv =
1.8544 P/d kg/mm2
where P is the applied load and d is the
diagonal length of the indentation impression. The variations
of Vickers hardness number with the applied load for both
the samples are presented in the figure 2.
20 30 40 50 60 70 80
26
28
30
32
34
36
38
40
42
Hardnessnumber(kg/mm
2
)
Load (grams)
Undoped LAM crystal
LAM + 1 mole % of urea
Figure 2. Variation of hardness number with the applied
load for undoped and urea doped LAM crystals.
It is observed from the figure that the hardness increases as
the load increases. Cracks are formed beyond 100 g and the
formation of cracks on the surface of the crystal beyond the
load 100 g is due to the release of the internal stresses
generated locally by indentation. The increase of
microhardness with increasing load is in agreement with the
Reverse Indentation Size Effect (RISE) as reported in the
literature [6].
Second Harmonic Generation (SHG) test for the grown
pure and urea-doped LAM crystals was performed by the
powder technique of Kurtz and Perry [7] using a pulsed
Nd:YAG laser(Model: YG501C,
of 4 mJ/pulse, pulse width of 10 ns and repetition rate of 10
Hz were used. The grown crystals were ground to powder of
grain size 300-500 µm and the input laser beam was passed
through IR reflector and directed on the powdered sample
packed in a capillary tube. Mirocrystalline material of
potassium dihydrogen phosphate (KDP) was used as reference
in this experiment. Second Harmonic Generation (SHG) from
the samples was detected using an optical cable attached to a
fluorescence spectroscope(Model: DID A-512 G/R). The
SHG efficiency for undoped LAM crystal is found to be 1.15
times and for urea doped LAM crystal is observed to be 1.34
times that of KDP sample and hence the samples are the
second harmonic generators.
The dielectric constant determines the share of the
electric stress which is absorbed by the material without any
dielectric breakdown. When an electric field acts on any
matter the latter dissipates a certain quantity of electrical
energy that transforms into heat energy. This phenomenon is
commonly known as loss of power, meaning an average
electric power dissipated in matter during a certain interval of
time. The amount of power losses in a dielectric under the
action of the voltage applied to it is commonly known as
dielectric losses. The lower the dielectric loss the more
effective is a dielectric material. Dielectric constant and
dielectric loss values of crystalline samples were measured
using a two-probe arrangement and an LCR meter. The
measured values of dielectric constant and dielectric loss at
different temperatures at frequency of 103
Hz for the samples
viz. undoped and urea doped LAM crystals are presented in
the figures 3 and 4.
30 35 40 45 50 55 60 65 70 75
3
4
5
6
7
8
9
10
11
12
Dielectricconstant
Temperature (
o
C)
Undoped LAM crystal
LAM + 1 mole% of urea
Figure 3. Variation of dielectric constant with the
temperature at frequency of 1000 Hz for undoped and
urea doped LAM crystals.
From the results, it is observed that dielectric
parameters such as dielectric constant and loss factor increase
with increase in temperature for both the samples. The same
behaviour is exhibited by dielectric loss (tan In
accordance with Miller’s rule, the low value of dielectric
constant is a suitable parameter for the enhancement of SHG
coefficient and low values of dielectric loss reveals the high
optical quality of the crystals with lesser defects, which is the
desirable property for NLO applications [8]. Variation of the
dielectric parameters of the sample with temperature is
International Journal of Science and Engineering Applications
Special Issue NCRTAM ISSN-2319-7560 (Online)
www.ijsea.com 37
generally attributed to the crystal expansion, the electronic,
space charge and ionic polarizations and also due to the
thermally generated charge carriers. When urea is added into
the LAM crystal as the dopant, it is noticed that the dielectric
parameters are found to be increasing which may be due to
presence of defects in the host crystal.
30 40 50 60 70
0.1
0.2
0.3
0.4
0.5
0.6
0.7
Dielectricloss
Temperature (
o
C)
Undoped LAM crystal
LAM + 1 mole % of urea
Figure 4. Variation of dielectric loss with the temperature
at frequency of 1000 Hz for undoped and urea doped
LAM crystals
4. CONCLUSION
Two samples viz. undoped and urea doped L-alanine
maleate crystals were grown by solution method. Solubility in
water is found to be increasing with temperature for the both
samples. XRD study reveals that the grown crystals crystallize
orthorhombic structure. The mechanical strength of the
samples was analyzed by hardness studies and SHG was
tested by Kurtz powder method. The dielectric constant, loss
factor and SHG values reveal that the grown crystals are
suitable materials for optical communication, electro-optic
modulation and optical computing.
ACKNOWLEDGEMENT
The authors are thankful to the supported work from
the various research institutions such as Crescent
Engineering College (Chennai), St.Joseph’s College, Trichy
and M.K. University (Madurai). The authors are grateful to
authorities of management of MDT Hindu College,
Tirunelveli and Aditanar College of Arts and Science,
Tiruchendur for the encouragement given to us to carry out
the research work.
REFERENCES
[1] Diem M., Polavarapu P.L., Oboodi M., Nafie L.A., J.
Am. Chem. Soc. 104 (1982) 3329.
[2] Lucia Rose A.S.J., Selvarajan P., Perumal S., Mater.
Chem.Phys.130 (2011) 950.
[3] Diem M., Polavarapu P.L., Oboodi M., Nafie L.A., J.
Am. Chem. Soc. 104 (1982) 3329.
[4] Cunningham G.A., McClenaghan N.H., Flatt P.R.,
Newsholme P., Clinical Sci. 109 (2005) 447.
[5] Shanthi A., Krishnan C. and Selvarajan P. Phys. Scr.
88 (2013) 035801.
[6] Sangwal K., Cryst. Res. Technol. 44, No.10 (2009) 1019.
[7] Kurtz S.K. , Perry T.T.,J.Appl. Phys.39 (1968) 3798.
[8] Glorium Arul Raj J., Selvarajan P., Perumal S., and
Murali Krishnan N., Mater. Manufact. Processes,
26 (2011) 1254.

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Growth, structural, mechanical and dielectric studies of undoped and urea doped L-alaninium maleate (LAM) crystals

  • 1. International Journal of Science and Engineering Applications Special Issue NCRTAM ISSN-2319-7560 (Online) www.ijsea.com 35 Growth, structural, mechanical and dielectric studies of undoped and urea doped L-alaninium maleate (LAM) crystals M. Krishnasamy Department of physics, S.T.Hindu college, Nagercoil, India. S.Subramanian, Department of physics, The M.D.T.Hindu College, Tirunelveli.,India. P.Selvarajan. Department of physics, Aditanar college of Arts and Science, Tiruchendur.India Abstract Undoped and urea doped L-alaninium maleate crystals were grown by solution method with slow evaporation technique. Solubility studies were carried out for the grown crystals and it is found that solubility increases with temperature for both the samples. XRD studies were performed to find the crystal structure of the samples. NLO activity of the grown crystals was studied using a Nd:YAG laser and SHG efficiency was found for both the samples. Microhardness studies were performed to understand the mechanical strength of the samples. Measurements of values of dielectric constant and dielectric loss were carried out and the electrical processes that are taking place in the samples are discussed. Keywords: Amino acid complex; NLO; doping; single crystal; solution growth; spectroscopy; SHG; hardness 1. INTRODUCTION Nonlinear Optical (NLO) materials have potential applications in Second Harmonic Generation (SHG), optical storage, optical communication, photonics, .electro-optic modulation, optical parametric amplifiers , optical image processing etc [1,2]. L-alanine is an alpha amino acid with NLO activity and it has the chemical formula CH3CHNH2COOH. It is a white odorless crystal powder and easily dissolves in water, slightly dissolves in alcohol and undissolves in ether. L-alanine is a conditionally essential amino acid and it is an important source of energy for muscle tissue, the brain and central nervous system. L-alanine strengthens the immune system by producing antibodies, helps in the metabolism of organic acids and sugars and is used by protein synthesis and immune system regulation [3,4]. Considering the importance of L-alanine, it is combined with maleic acid to form L-alaninium maleate (LAM). To improve the NLO activity and other properties of LAM crystal, urea was added as the dopant into LAM in this work. The aim of this work is to report on the growth of undoped and urea doped LAM crystals and to discuss the results obtained from various studies such as solubility studies, XRD, hardness studies, SHG studies and dielectric studies. 2. GROWTH AND SOLUBILITY L-alaninium maleate (LAM) sample was prepared from aqueous solutions of AR grade L-alanine and maleic acid taken in 1:1 molar ratio. The evaporation of the solution yielded LAM crystals. To obtain urea doped LAM, 1 mole% of urea was added the solution of LAM. The key factor for successful growth of any crystal is the proper selection of solvents. To find out the suitable solvent, the solubility test was carried out by gravimetrical method [5] and here water was found to be the suitable solvent for growing crystals. The solubility of the solute can be determined by dissolving the solute in the solvent maintained at a constant temperature with continuous stirring. On reaching saturation, equilibrium concentration of the solute can be determined. The solubility curves for undoped and urea doped LAM samples were plotted and they are shown in figure 1. It is observed that solubility increases with temperature for both the samples. When urea was doped into LAM crystal, it is noticed that the solubility increases leading to dissolution of more solute in the same amount of solvent. 30 35 40 45 50 24 25 26 27 28 29 30 31 Solubility(g/100ml) Temperature ( o C) Undoped LAM sample LAM + 1 mole% of urea Figuere 1. Solubility curves for undoped and urea doped LAM samples. 3. CHARACTERIZATION OF THE GROWN CRYSTALS Single crystal XRD data of undoped and urea doped LAM crystals were collected from a single crystal X-ray diffractometer with graphite mono chrormated MoKa
  • 2. International Journal of Science and Engineering Applications Special Issue NCRTAM ISSN-2319-7560 (Online) www.ijsea.com 36 radiation. The obtained crystallographic data for undoped LAM and urea doped LAM crystals are a=5.572(2) Å , b = 7.415(4) Å, c = 23.674(3) Å , α = β = γ = 90° and a= o o o respectively. From the data, it is observed that both the grown crystals crystallize in orthorhombic crystal systems. The number of molecules per unit cell (Z) for both crystals of this work is found to be 4. The slight changes in the lattice parameters are due to incorporation of urea in the lattice of LAM crystal. The mechanical property of crystals can be analyzed by carrying out microhardness studies using a Leitz Vickers microhardness tester. Measuring microhardness gives an idea about the mechanical strength of a material. The hardness of a material is a measure of its resistance to plastic deformation. In an ideal crystal, the hardness value should be independent of applied load. But in a real crystal, the load dependence is observed. This is due to normal indentation size effect (ISE). The hardness number was measured for undoped and urea doped LAM crystals by applying different loads. The Vickers microhardness number was calculated using the relation Hv = 1.8544 P/d kg/mm2 where P is the applied load and d is the diagonal length of the indentation impression. The variations of Vickers hardness number with the applied load for both the samples are presented in the figure 2. 20 30 40 50 60 70 80 26 28 30 32 34 36 38 40 42 Hardnessnumber(kg/mm 2 ) Load (grams) Undoped LAM crystal LAM + 1 mole % of urea Figure 2. Variation of hardness number with the applied load for undoped and urea doped LAM crystals. It is observed from the figure that the hardness increases as the load increases. Cracks are formed beyond 100 g and the formation of cracks on the surface of the crystal beyond the load 100 g is due to the release of the internal stresses generated locally by indentation. The increase of microhardness with increasing load is in agreement with the Reverse Indentation Size Effect (RISE) as reported in the literature [6]. Second Harmonic Generation (SHG) test for the grown pure and urea-doped LAM crystals was performed by the powder technique of Kurtz and Perry [7] using a pulsed Nd:YAG laser(Model: YG501C, of 4 mJ/pulse, pulse width of 10 ns and repetition rate of 10 Hz were used. The grown crystals were ground to powder of grain size 300-500 µm and the input laser beam was passed through IR reflector and directed on the powdered sample packed in a capillary tube. Mirocrystalline material of potassium dihydrogen phosphate (KDP) was used as reference in this experiment. Second Harmonic Generation (SHG) from the samples was detected using an optical cable attached to a fluorescence spectroscope(Model: DID A-512 G/R). The SHG efficiency for undoped LAM crystal is found to be 1.15 times and for urea doped LAM crystal is observed to be 1.34 times that of KDP sample and hence the samples are the second harmonic generators. The dielectric constant determines the share of the electric stress which is absorbed by the material without any dielectric breakdown. When an electric field acts on any matter the latter dissipates a certain quantity of electrical energy that transforms into heat energy. This phenomenon is commonly known as loss of power, meaning an average electric power dissipated in matter during a certain interval of time. The amount of power losses in a dielectric under the action of the voltage applied to it is commonly known as dielectric losses. The lower the dielectric loss the more effective is a dielectric material. Dielectric constant and dielectric loss values of crystalline samples were measured using a two-probe arrangement and an LCR meter. The measured values of dielectric constant and dielectric loss at different temperatures at frequency of 103 Hz for the samples viz. undoped and urea doped LAM crystals are presented in the figures 3 and 4. 30 35 40 45 50 55 60 65 70 75 3 4 5 6 7 8 9 10 11 12 Dielectricconstant Temperature ( o C) Undoped LAM crystal LAM + 1 mole% of urea Figure 3. Variation of dielectric constant with the temperature at frequency of 1000 Hz for undoped and urea doped LAM crystals. From the results, it is observed that dielectric parameters such as dielectric constant and loss factor increase with increase in temperature for both the samples. The same behaviour is exhibited by dielectric loss (tan In accordance with Miller’s rule, the low value of dielectric constant is a suitable parameter for the enhancement of SHG coefficient and low values of dielectric loss reveals the high optical quality of the crystals with lesser defects, which is the desirable property for NLO applications [8]. Variation of the dielectric parameters of the sample with temperature is
  • 3. International Journal of Science and Engineering Applications Special Issue NCRTAM ISSN-2319-7560 (Online) www.ijsea.com 37 generally attributed to the crystal expansion, the electronic, space charge and ionic polarizations and also due to the thermally generated charge carriers. When urea is added into the LAM crystal as the dopant, it is noticed that the dielectric parameters are found to be increasing which may be due to presence of defects in the host crystal. 30 40 50 60 70 0.1 0.2 0.3 0.4 0.5 0.6 0.7 Dielectricloss Temperature ( o C) Undoped LAM crystal LAM + 1 mole % of urea Figure 4. Variation of dielectric loss with the temperature at frequency of 1000 Hz for undoped and urea doped LAM crystals 4. CONCLUSION Two samples viz. undoped and urea doped L-alanine maleate crystals were grown by solution method. Solubility in water is found to be increasing with temperature for the both samples. XRD study reveals that the grown crystals crystallize orthorhombic structure. The mechanical strength of the samples was analyzed by hardness studies and SHG was tested by Kurtz powder method. The dielectric constant, loss factor and SHG values reveal that the grown crystals are suitable materials for optical communication, electro-optic modulation and optical computing. ACKNOWLEDGEMENT The authors are thankful to the supported work from the various research institutions such as Crescent Engineering College (Chennai), St.Joseph’s College, Trichy and M.K. University (Madurai). The authors are grateful to authorities of management of MDT Hindu College, Tirunelveli and Aditanar College of Arts and Science, Tiruchendur for the encouragement given to us to carry out the research work. REFERENCES [1] Diem M., Polavarapu P.L., Oboodi M., Nafie L.A., J. Am. Chem. Soc. 104 (1982) 3329. [2] Lucia Rose A.S.J., Selvarajan P., Perumal S., Mater. Chem.Phys.130 (2011) 950. [3] Diem M., Polavarapu P.L., Oboodi M., Nafie L.A., J. Am. Chem. Soc. 104 (1982) 3329. [4] Cunningham G.A., McClenaghan N.H., Flatt P.R., Newsholme P., Clinical Sci. 109 (2005) 447. [5] Shanthi A., Krishnan C. and Selvarajan P. Phys. Scr. 88 (2013) 035801. [6] Sangwal K., Cryst. Res. Technol. 44, No.10 (2009) 1019. [7] Kurtz S.K. , Perry T.T.,J.Appl. Phys.39 (1968) 3798. [8] Glorium Arul Raj J., Selvarajan P., Perumal S., and Murali Krishnan N., Mater. Manufact. Processes, 26 (2011) 1254.