3. DataView
DataView is a fast, easy-to-use data
analysis tool for evaluating
semiconductor test data.
In addition to generating reports,
DataView allows you to easily
navigate your data and understand
process performance.
DataView is ideal for test or product
engineers who need a quick, powerful,
and intuitive tool for analyzing
production and characterization data.
4. DataView
Whether you are developing a
new test program, optimizing an
existing program, or evaluating
characterization data, DataView
allows you to visualize what’s
happening with your data.
5. DataView
DataView is a powerful, easy-to-use
data processor geared for the busy
Test Engineer.
DataView helps to quickly identify test
issues such as site-to-site variation,
current/voltage range problems,
repeatability/reproducibility issues,
problematic tests, data integrity issues
and more.
6. DataView
DataView: Process View
View all Data File Information such as total device
records, passing & failing record count, unique
device ids, active test sites, lot id, part type, and
more.
Test Data Info and Warnings - identify possible
duplicate test numbers, inconsistencies with test
limits, names and units, tests with no limits, alarms,
zero standard deviations and low Cpks.
View average test time information as well as lot
processing statistics.
8. DataView
DataView: Record View
Group devices from any file, by site, wafer, etc. into analysis
DataSets.
View the high-level test information for all device test
records, such as Device ID, Pass/Fail status, Site, Soft and
Hard Bin, and DataSet.
Easily exclude or include test records for analysis.
Select test records by file, bin, pass/fail status, site or pick
and choose test records individually.
One click removal of all failing devices or retested devices.
Identify soft and hard bin types, counts, and percentages.
Double-click on any record to see the detailed test results in
the Table View.
10. DataView
DataView: Table View
Provides a spreadsheet view of all test data.
View the statistics and/or test values for each test.
View the individual test record for any device.
View the stats and/or values for all test data, by site, by wafer, or by
defined DataSet.
Sort the table by any column, hide tests and columns.
Quickly produce an Excel spreadsheet of any Table View or select
multiple spreadsheets for saving into a report.
Compare individual device test records and compare any DataSet
to another set (Site to Site, Site to All, Wafer to DataSet, etc…).
Select and copy/paste any subset of values to/from the Table View
to Excel, text file, email, etc.
Select tests from Table View for quick generation of Histograms into
a report.
Double-click on any test to jump to the histogram in the Histo View.
12. DataView
Data View: Bin View
View soft or hard bin paretos for all test data, by site,
wafer or any defined DataSet.
Compare different paretos by site, wafer, or defined
DataSet.
Save the bin paretos to file for easy insertion into an
email or select multiple paretos for saving into a
report.
View and sort all bins by count, percentage, and bin
number.
14. DataView
DataView: Bin View
High quality wafermaps for each wafer.
View wafermaps by soft or hard test bins.
View soft/hard binning information for each wafer
directly within each wafermap.
Easily identify any retested die.
Hover the mouse over any die to see the X-Y
coordinates, binning and site information.
Double-click on any die and jump to the device test
record in the Table View.
16. DataView
DataView: Histo View
Produce high-quality Histograms for all parametric
data.
Adjustable X-axis scale and histogram bins for
optimum viewing.
Detailed test data and statistics are provided in the
Histo View.
View histograms for multiple sites, wafers, or
DataSets in the same image.
Quickly produce an image file for insertion into an
email or select multiple images for saving into a
report.
Hover over any histogram bin to see the value, bin
number, bin count, and site/wafer/DataSet info.
18. DataView
DataView: Trend View
Produce high-quality Trend Charts for all
parametric data.
Adjustable Y-axis scale and X-axis zoom
capabilities allow for optimum viewing.
View multiple sites, wafers, and DataSets in the
same chart.
Double-click on any data point to view the test
record for that device in Table View.
20. DataView
DataView: Reports and Images
Generate histograms, box plots, cumulative density
plots, trend charts, bin paretos, wafer maps,
parametric wafer maps and more.
Generate statistical tables for each site, wafer, process
and custom DataSets or include tables of the raw
values for any DataSet.
Customize reports to include what you consider
important – select tables, graphs, and images as
you analyze your data.
Select desired parameters for each table and graph –
arrange and align items to present data the way
you want it to be seen.
21. DataView
Da t a V ie w: R e p o r t s a n d
I ma g e s
Histo View Process View Wafer View
Table Trend View Bin View
22. DataView
For a complete demo on DataView
please let us know and we will be
happy to schedule a full demo with
you.
You can also download a working
demo of DataView from our web
site at http://testspectrum.com.
23. DataView
For more information on all of our Test Tools please visit our
web site at http://testspectrum.com/home/solutions/tools/