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Device Modeling Report

COMPONENTS: MOSFET (Model Parameters)
PART NUMBER: SSM3J35CT
MANUFACTURER: TOSHIBA
REMARK: Body Diode (Model Parameters)

Bee Technologies Inc.

All Rights Reserved Copyright (c) Bee Technologies Inc. 2010
1
MOSFET MODEL
PSpice model
parameter
LEVEL
L
W
KP
RS
RD
VTO
RDS
TOX
CGSO
CGDO
CBD
MJ
PB
FC
RG
IS
N
RB
PHI
GAMMA
DELTA
ETA
THETA
KAPPA
VMAX
XJ
UO

Model description
Channel Length
Channel Width
Transconductance
Source Ohmic Resistance
Ohmic Drain Resistance
Zero-bias Threshold Voltage
Drain-Source Shunt Resistance
Gate Oxide Thickness
Zero-bias Gate-Source Capacitance
Zero-bias Gate-Drain Capacitance
Zero-bias Bulk-Drain Junction Capacitance
Bulk Junction Grading Coefficient
Bulk Junction Potential
Bulk Junction Forward-bias Capacitance Coefficient
Gate Ohmic Resistance
Bulk Junction Saturation Current
Bulk Junction Emission Coefficient
Bulk Series Resistance
Surface Inversion Potential
Body-effect Parameter
Width effect on Threshold Voltage
Static Feedback on Threshold Voltage
Mobility Modulation
Saturation Field Factor
Maximum Drift Velocity of Carriers
Metallurgical Junction Depth
Surface Mobility

All Rights Reserved Copyright (c) Bee Technologies Inc. 2010
2
Transconductance Characteristics
Circuit Simulation Result
300
Measurement
Simulation

gfs (mS)

200

100

0
0

100

200

Drain current ID (-mA)
Comparison table

Id(-mA)

gfs (mS)
Measurement
Simulation

%Error

5
10

40.000
57.000

40.807
57.701

2.02
1.23

20

82.000

81.582

-0.51

50

131.000

128.933

-1.58

100
200

186.000
265.000

182.239
257.534

-2.02
-2.82

All Rights Reserved Copyright (c) Bee Technologies Inc. 2010
3
Vgs-Id Characteristics
Circuit Simulation result
-1.0A

-1.0mA
0V -0.2V
I(V3)

-0.6V

-1.0V

-1.4V

-1.8V

-2.2V

-2.6V -3.0V

V_V1

Evaluation circuit
V3

0Vdc
V2
U1
SSM3J35CT

-3

V1

0Vdc

0

All Rights Reserved Copyright (c) Bee Technologies Inc. 2010
4
Comparison Graph
Circuit Simulation Result
1000
Measurement

Drain current ID (-mA)

Simulation

100

10

1
0

1

2

3

Gate-source voltage V GS (-V)
Simulation Result

ID(-mA)
1
2
5
10
20
50
100
200

VGS(-V)
Measurement
0.670
0.730
0.820
0.920
1.040
1.290
1.600
2.050

Simulation
0.675
0.720
0.811
0.912
1.056
1.341
1.662
2.117

%Error
0.74
-1.31
-1.16
-0.87
1.50
3.92
3.87
3.25

All Rights Reserved Copyright (c) Bee Technologies Inc. 2010
5
Rds(on) Characteristics
Circuit Simulation result
-50mA

-25mA

0A
0V

-20mV
I(V3)

-60mV

-100mV

-140mV

-180mV

-220mV

V_VDS

Evaluation circuit
V3

0Vdc
VDS
U1
SSM3J35CT

0Vdc

V1
-4

0

Simulation Result
ID = -50mA, VGS = -4V
R DS (on)



Measurement
4.300

Simulation
4.300

%Error
0.00

All Rights Reserved Copyright (c) Bee Technologies Inc. 2010
6
Gate Charge Characteristics
Circuit Simulation result
-8.0V
-7.0V
-6.0V
-5.0V
-4.0V
-3.0V
-2.0V
-1.0V
0V
0

0.2n

0.4n

0.6n

0.8n

1.0n

V(W1:4)
Time*1mA

Evaluation circuit

ION = 0uA
IOFF = 1mA
W

I2
100m

VDD

+

I1

-

I1 = 0
I2 = 1m
TD = 0
TR = 0.5n
TF = 1n
PW = 600u
PER = 1000u

U1
D2
SSM3J35CTDbreak

W1

-16

0

Simulation Result
VDD=-16V, ID=-0.1A,
VGS=-4V
Qgs
nC
Qgd
nC
Qg
nC

Measurement
0.070
0.100
0.480

Simulation

%Error

0.070
0.101
0.358

-0.13
0.88
-25.36

All Rights Reserved Copyright (c) Bee Technologies Inc. 2010
7
Gate Charge Characteristics

Reference

Gate-Source Volatge Vgs (-V)

8

6

4

2

0
0

0.2

0.4

0.6

0.8

1

Gate Charge Qg(nc)

All Rights Reserved Copyright (c) Bee Technologies Inc. 2010
8
Capacitance Characteristics

Measurement
Simulation

Simulation Result
VDS (-V)
0.1
0.2
0.5
1
2
5
10
20

Cbd (pF)
Measurement
Simulation
26.000
25.900
21.000
21.100
14.200
14.220
9.800
9.750
6.300
6.388
3.400
3.514
2.200
2.200
1.400
1.370

%Error
-0.38
0.48
0.14
-0.51
1.40
3.35
0.00
-2.14

All Rights Reserved Copyright (c) Bee Technologies Inc. 2010
9
Switching Time Characteristics
Circuit Simulation result
-4.0V
-3.5V
-3.0V
-2.5V
-2.0V
-1.5V
-1.0V
-0.5V
0V
0.6us 0.8us 1.0us 1.2us 1.4us
V(U1:G)
V(U1:D)

1.6us

1.8us 2.0us

2.2us 2.4us

Time

Evaluation circuit

L2
30nH

R1 50
PER = 1m
PW = 10u
TF = 4n
TR = 4n
TD = 1u
V2 = 5
V1 = 0

RL
54

L1
U1
SSM3J35CT

VDD
-3Vdc

30nH
R2
50

V2

0

Simulation Result
ID=-50mA, VDD=-3V
VGS=-2.5/0V
ton

ns

Measurement
175.000

Simulation

%Error

174.162

-0.48

All Rights Reserved Copyright (c) Bee Technologies Inc. 2010
10
Output Characteristics
Circuit Simulation result

-250mA

-10

-4

-2.5

-200mA

-150mA

-1.8
-100mA

-1.5
-50mA

VGS = -1.2V

0A
0V

-0.5V

-1.0V

-1.5V

-2.0V

I(V3)
V_V2

Evaluation circuit
V3

0Vdc

V2
U1
SSM3J35CT
V1

0

All Rights Reserved Copyright (c) Bee Technologies Inc. 2010
11
Forward Current Characteristics
Circuit Simulation Result
1.0A

100mA

10mA

1.0mA

100uA

10uA
0V

0.2V
I(Vsense)

0.4V

0.6V

0.8V

1.0V

1.2V

1.4V

V_VDS

Evaluation Circuit
Vsense

0Vdc

VDS

U1
SSM3J35CT

0

All Rights Reserved Copyright (c) Bee Technologies Inc. 2010
12
Comparison Graph
Circuit Simulation Result
1000

Drian reverse current IDR (mA)

Measurement

Simulation

100

10

1

0.1

0.01
0

0.2

0.4

0.6

0.8

1

1.2

1.4

Drain - source voltage VDS (V)
Simulation Result
IDR(mA)
0.01
0.1
1
10
20
50
100
200

VDS(V)
Measurement
Simulation
0.480
0.482
0.565
0.561
0.640
0.628
0.720
0.715
0.745
0.742
0.785
0.779
0.810
0.809
0.845
0.844

%Error
0.37
-0.65
-1.90
-0.74
-0.43
-0.80
-0.13
-0.17

All Rights Reserved Copyright (c) Bee Technologies Inc. 2010
13
Reverse Recovery Characteristics
Circuit Simulation Result
400mA
300mA
200mA
100mA
-0mA
-100mA
-200mA
-300mA
-400mA
9.7us 9.8us 9.9us
I(R1)

10.1us

10.3us

10.5us

10.7us

Time

Evaluation Circuit
R1
50

V1 = -9.2V
V2 = 10.9v
TD = 70ns
TR = 15ns
TF = 15ns
PW = 10us
PER = 100us

V1
U1
SSM3J35CT

0

Compare Measurement vs. Simulation
Measurement
trj

ns

26.000

Simulation

%Error

25.913

-0.33

All Rights Reserved Copyright (c) Bee Technologies Inc. 2010
14
Reverse Recovery Characteristics

Reference
Measurement

Trj = 26.00 (ns)
Trb = 66.00(ns)
Conditions: Ifwd = lrev = 0.2(A), Rl = 50

Example

Relation between trj and trb

All Rights Reserved Copyright (c) Bee Technologies Inc. 2010
15
ESD PROTECTION DIODE SPICE MODEL
Zener Voltage Characteristics
Circuit Simulation Result
-10mA
-9mA
-8mA
-7mA
-6mA
-5mA
-4mA
-3mA
-2mA
-1mA
0A
0V

-5V
I(R1)

-10V

-15V

-20V

-25V

-30V

-35V

-40V

-45V

V_V1

Evaluation Circuit

R1

R2
U1
SSM3J35CT
100MEG

V1
0.001m
0Vdc

0

All Rights Reserved Copyright (c) Bee Technologies Inc. 2010
16
Zener Voltage Characteristics

Reference

All Rights Reserved Copyright (c) Bee Technologies Inc. 2010
17

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Semelhante a Device and Diode Modeling Report for TOSHIBA MOSFET SSM3J35CT (14)

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Device and Diode Modeling Report for TOSHIBA MOSFET SSM3J35CT

  • 1. Device Modeling Report COMPONENTS: MOSFET (Model Parameters) PART NUMBER: SSM3J35CT MANUFACTURER: TOSHIBA REMARK: Body Diode (Model Parameters) Bee Technologies Inc. All Rights Reserved Copyright (c) Bee Technologies Inc. 2010 1
  • 2. MOSFET MODEL PSpice model parameter LEVEL L W KP RS RD VTO RDS TOX CGSO CGDO CBD MJ PB FC RG IS N RB PHI GAMMA DELTA ETA THETA KAPPA VMAX XJ UO Model description Channel Length Channel Width Transconductance Source Ohmic Resistance Ohmic Drain Resistance Zero-bias Threshold Voltage Drain-Source Shunt Resistance Gate Oxide Thickness Zero-bias Gate-Source Capacitance Zero-bias Gate-Drain Capacitance Zero-bias Bulk-Drain Junction Capacitance Bulk Junction Grading Coefficient Bulk Junction Potential Bulk Junction Forward-bias Capacitance Coefficient Gate Ohmic Resistance Bulk Junction Saturation Current Bulk Junction Emission Coefficient Bulk Series Resistance Surface Inversion Potential Body-effect Parameter Width effect on Threshold Voltage Static Feedback on Threshold Voltage Mobility Modulation Saturation Field Factor Maximum Drift Velocity of Carriers Metallurgical Junction Depth Surface Mobility All Rights Reserved Copyright (c) Bee Technologies Inc. 2010 2
  • 3. Transconductance Characteristics Circuit Simulation Result 300 Measurement Simulation gfs (mS) 200 100 0 0 100 200 Drain current ID (-mA) Comparison table Id(-mA) gfs (mS) Measurement Simulation %Error 5 10 40.000 57.000 40.807 57.701 2.02 1.23 20 82.000 81.582 -0.51 50 131.000 128.933 -1.58 100 200 186.000 265.000 182.239 257.534 -2.02 -2.82 All Rights Reserved Copyright (c) Bee Technologies Inc. 2010 3
  • 4. Vgs-Id Characteristics Circuit Simulation result -1.0A -1.0mA 0V -0.2V I(V3) -0.6V -1.0V -1.4V -1.8V -2.2V -2.6V -3.0V V_V1 Evaluation circuit V3 0Vdc V2 U1 SSM3J35CT -3 V1 0Vdc 0 All Rights Reserved Copyright (c) Bee Technologies Inc. 2010 4
  • 5. Comparison Graph Circuit Simulation Result 1000 Measurement Drain current ID (-mA) Simulation 100 10 1 0 1 2 3 Gate-source voltage V GS (-V) Simulation Result ID(-mA) 1 2 5 10 20 50 100 200 VGS(-V) Measurement 0.670 0.730 0.820 0.920 1.040 1.290 1.600 2.050 Simulation 0.675 0.720 0.811 0.912 1.056 1.341 1.662 2.117 %Error 0.74 -1.31 -1.16 -0.87 1.50 3.92 3.87 3.25 All Rights Reserved Copyright (c) Bee Technologies Inc. 2010 5
  • 6. Rds(on) Characteristics Circuit Simulation result -50mA -25mA 0A 0V -20mV I(V3) -60mV -100mV -140mV -180mV -220mV V_VDS Evaluation circuit V3 0Vdc VDS U1 SSM3J35CT 0Vdc V1 -4 0 Simulation Result ID = -50mA, VGS = -4V R DS (on)  Measurement 4.300 Simulation 4.300 %Error 0.00 All Rights Reserved Copyright (c) Bee Technologies Inc. 2010 6
  • 7. Gate Charge Characteristics Circuit Simulation result -8.0V -7.0V -6.0V -5.0V -4.0V -3.0V -2.0V -1.0V 0V 0 0.2n 0.4n 0.6n 0.8n 1.0n V(W1:4) Time*1mA Evaluation circuit ION = 0uA IOFF = 1mA W I2 100m VDD + I1 - I1 = 0 I2 = 1m TD = 0 TR = 0.5n TF = 1n PW = 600u PER = 1000u U1 D2 SSM3J35CTDbreak W1 -16 0 Simulation Result VDD=-16V, ID=-0.1A, VGS=-4V Qgs nC Qgd nC Qg nC Measurement 0.070 0.100 0.480 Simulation %Error 0.070 0.101 0.358 -0.13 0.88 -25.36 All Rights Reserved Copyright (c) Bee Technologies Inc. 2010 7
  • 8. Gate Charge Characteristics Reference Gate-Source Volatge Vgs (-V) 8 6 4 2 0 0 0.2 0.4 0.6 0.8 1 Gate Charge Qg(nc) All Rights Reserved Copyright (c) Bee Technologies Inc. 2010 8
  • 9. Capacitance Characteristics Measurement Simulation Simulation Result VDS (-V) 0.1 0.2 0.5 1 2 5 10 20 Cbd (pF) Measurement Simulation 26.000 25.900 21.000 21.100 14.200 14.220 9.800 9.750 6.300 6.388 3.400 3.514 2.200 2.200 1.400 1.370 %Error -0.38 0.48 0.14 -0.51 1.40 3.35 0.00 -2.14 All Rights Reserved Copyright (c) Bee Technologies Inc. 2010 9
  • 10. Switching Time Characteristics Circuit Simulation result -4.0V -3.5V -3.0V -2.5V -2.0V -1.5V -1.0V -0.5V 0V 0.6us 0.8us 1.0us 1.2us 1.4us V(U1:G) V(U1:D) 1.6us 1.8us 2.0us 2.2us 2.4us Time Evaluation circuit L2 30nH R1 50 PER = 1m PW = 10u TF = 4n TR = 4n TD = 1u V2 = 5 V1 = 0 RL 54 L1 U1 SSM3J35CT VDD -3Vdc 30nH R2 50 V2 0 Simulation Result ID=-50mA, VDD=-3V VGS=-2.5/0V ton ns Measurement 175.000 Simulation %Error 174.162 -0.48 All Rights Reserved Copyright (c) Bee Technologies Inc. 2010 10
  • 11. Output Characteristics Circuit Simulation result -250mA -10 -4 -2.5 -200mA -150mA -1.8 -100mA -1.5 -50mA VGS = -1.2V 0A 0V -0.5V -1.0V -1.5V -2.0V I(V3) V_V2 Evaluation circuit V3 0Vdc V2 U1 SSM3J35CT V1 0 All Rights Reserved Copyright (c) Bee Technologies Inc. 2010 11
  • 12. Forward Current Characteristics Circuit Simulation Result 1.0A 100mA 10mA 1.0mA 100uA 10uA 0V 0.2V I(Vsense) 0.4V 0.6V 0.8V 1.0V 1.2V 1.4V V_VDS Evaluation Circuit Vsense 0Vdc VDS U1 SSM3J35CT 0 All Rights Reserved Copyright (c) Bee Technologies Inc. 2010 12
  • 13. Comparison Graph Circuit Simulation Result 1000 Drian reverse current IDR (mA) Measurement Simulation 100 10 1 0.1 0.01 0 0.2 0.4 0.6 0.8 1 1.2 1.4 Drain - source voltage VDS (V) Simulation Result IDR(mA) 0.01 0.1 1 10 20 50 100 200 VDS(V) Measurement Simulation 0.480 0.482 0.565 0.561 0.640 0.628 0.720 0.715 0.745 0.742 0.785 0.779 0.810 0.809 0.845 0.844 %Error 0.37 -0.65 -1.90 -0.74 -0.43 -0.80 -0.13 -0.17 All Rights Reserved Copyright (c) Bee Technologies Inc. 2010 13
  • 14. Reverse Recovery Characteristics Circuit Simulation Result 400mA 300mA 200mA 100mA -0mA -100mA -200mA -300mA -400mA 9.7us 9.8us 9.9us I(R1) 10.1us 10.3us 10.5us 10.7us Time Evaluation Circuit R1 50 V1 = -9.2V V2 = 10.9v TD = 70ns TR = 15ns TF = 15ns PW = 10us PER = 100us V1 U1 SSM3J35CT 0 Compare Measurement vs. Simulation Measurement trj ns 26.000 Simulation %Error 25.913 -0.33 All Rights Reserved Copyright (c) Bee Technologies Inc. 2010 14
  • 15. Reverse Recovery Characteristics Reference Measurement Trj = 26.00 (ns) Trb = 66.00(ns) Conditions: Ifwd = lrev = 0.2(A), Rl = 50 Example Relation between trj and trb All Rights Reserved Copyright (c) Bee Technologies Inc. 2010 15
  • 16. ESD PROTECTION DIODE SPICE MODEL Zener Voltage Characteristics Circuit Simulation Result -10mA -9mA -8mA -7mA -6mA -5mA -4mA -3mA -2mA -1mA 0A 0V -5V I(R1) -10V -15V -20V -25V -30V -35V -40V -45V V_V1 Evaluation Circuit R1 R2 U1 SSM3J35CT 100MEG V1 0.001m 0Vdc 0 All Rights Reserved Copyright (c) Bee Technologies Inc. 2010 16
  • 17. Zener Voltage Characteristics Reference All Rights Reserved Copyright (c) Bee Technologies Inc. 2010 17