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All Rights Reserved Copyright (C) Bee Technologies Inc. 2014
1
Device Modeling Report
Bee Technologies Inc.
COMPONENTS: SiC Schottky Barrier Diode
PART NUMBER: SCS215AE
MANUFACTURER: ROHM
REAMARK: POFESSIONAL MODEL
All Rights Reserved Copyright (C) Bee Technologies Inc. 2014
2
2
1
3
Circuit Configuration
DIODE MODEL PARAMETERS
PSpice
model
parameter
Model description
IS Saturation Current
N Emission Coefficient
RS Series Resistance
IKF High-injection Knee Current
CJO Zero-bias Junction Capacitance
M Junction Grading Coefficient
VJ Junction Potential
ISR Recombination Current Saturation Value
BV Reverse Breakdown Voltage(a positive value)
IBV Reverse Breakdown Current(a positive value)
TT Transit Time
EG Energy-band Gap
All Rights Reserved Copyright (C) Bee Technologies Inc. 2014
3
R1
0.01m
V1
0Vdc
0
R2
1MEG
U1
SCS215AE_P
V_V1
0V 0.5V 1.0V 1.5V 2.0V 2.5V
I(R1)
1.0mA
10mA
100mA
1.0A
10A
100A
Forward Current Characteristics
Circuit Simulation result
Evaluation circuit
All Rights Reserved Copyright (C) Bee Technologies Inc. 2014
4
Comparison Graph
Circuit Simulation result
Comparison table
IF (A)
VF (V)
%Error
Measurement Simulation
0.001 0.700 0.696 -0.57
0.01 0.760 0.756 -0.53
0.1 0.820 0.818 -0.24
1 0.900 0.902 0.22
2 0.940 0.948 0.85
5 1.060 1.054 -0.57
10 1.200 1.208 0.67
20 1.500 1.493 -0.47
50 2.300 2.300 0.00
All Rights Reserved Copyright (C) Bee Technologies Inc. 2014
5
V1
TD = 0
TF = 500ns
PW = 100us
PER = 500us
V1 = 0
TR = 10us
V2 = 650
V2
0Vdc
0
U1
SCS215AE_P
R1
100MEG
V(N16650)
10mV 100mV 1.0V 10V 100V 1.0KV
I(V2)/(650V/10us)
10p
100p
1.0n
Junction Capacitance Characteristic
Circuit Simulation result
Evaluation circuit
All Rights Reserved Copyright (C) Bee Technologies Inc. 2014
6
Comparison Graph
Circuit Simulation result
Comparison table
VR (V)
CT (pF)
%Error
Measurement Simulation
0.01 780.000 776.700 -0.42
0.1 730.000 736.700 0.92
1 550.000 547.100 -0.53
10 230.000 221.000 -3.91
20 165.000 159.700 -3.21
50 111.000 107.300 -3.33
100 85.000 83.100 -2.24
200 66.000 67.500 2.27
600 54.000 53.400 -1.11
All Rights Reserved Copyright (C) Bee Technologies Inc. 2014
7
V1
0Vdc
R1
100m
0
U1
SCS215AE_P
R2
100MEG
V_V1
0V 200V 400V 600V
I(R1)
10nA
100nA
1.0uA
10uA
100uA
Reverse Characteristic
Circuit Simulation result
Evaluation circuit
All Rights Reserved Copyright (C) Bee Technologies Inc. 2014
8
Comparison Graph
Circuit Simulation result
Comparison table
IR (uA)
VR (V)
%Error
Measurement Simulation
0.01 406.0 397.1 -2.19
0.1 486.0 487.3 0.27
2.1 600.0 598.8 -0.20

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SPICE MODEL of SCS215AE (Professional Model) in SPICE PARK

  • 1. All Rights Reserved Copyright (C) Bee Technologies Inc. 2014 1 Device Modeling Report Bee Technologies Inc. COMPONENTS: SiC Schottky Barrier Diode PART NUMBER: SCS215AE MANUFACTURER: ROHM REAMARK: POFESSIONAL MODEL
  • 2. All Rights Reserved Copyright (C) Bee Technologies Inc. 2014 2 2 1 3 Circuit Configuration DIODE MODEL PARAMETERS PSpice model parameter Model description IS Saturation Current N Emission Coefficient RS Series Resistance IKF High-injection Knee Current CJO Zero-bias Junction Capacitance M Junction Grading Coefficient VJ Junction Potential ISR Recombination Current Saturation Value BV Reverse Breakdown Voltage(a positive value) IBV Reverse Breakdown Current(a positive value) TT Transit Time EG Energy-band Gap
  • 3. All Rights Reserved Copyright (C) Bee Technologies Inc. 2014 3 R1 0.01m V1 0Vdc 0 R2 1MEG U1 SCS215AE_P V_V1 0V 0.5V 1.0V 1.5V 2.0V 2.5V I(R1) 1.0mA 10mA 100mA 1.0A 10A 100A Forward Current Characteristics Circuit Simulation result Evaluation circuit
  • 4. All Rights Reserved Copyright (C) Bee Technologies Inc. 2014 4 Comparison Graph Circuit Simulation result Comparison table IF (A) VF (V) %Error Measurement Simulation 0.001 0.700 0.696 -0.57 0.01 0.760 0.756 -0.53 0.1 0.820 0.818 -0.24 1 0.900 0.902 0.22 2 0.940 0.948 0.85 5 1.060 1.054 -0.57 10 1.200 1.208 0.67 20 1.500 1.493 -0.47 50 2.300 2.300 0.00
  • 5. All Rights Reserved Copyright (C) Bee Technologies Inc. 2014 5 V1 TD = 0 TF = 500ns PW = 100us PER = 500us V1 = 0 TR = 10us V2 = 650 V2 0Vdc 0 U1 SCS215AE_P R1 100MEG V(N16650) 10mV 100mV 1.0V 10V 100V 1.0KV I(V2)/(650V/10us) 10p 100p 1.0n Junction Capacitance Characteristic Circuit Simulation result Evaluation circuit
  • 6. All Rights Reserved Copyright (C) Bee Technologies Inc. 2014 6 Comparison Graph Circuit Simulation result Comparison table VR (V) CT (pF) %Error Measurement Simulation 0.01 780.000 776.700 -0.42 0.1 730.000 736.700 0.92 1 550.000 547.100 -0.53 10 230.000 221.000 -3.91 20 165.000 159.700 -3.21 50 111.000 107.300 -3.33 100 85.000 83.100 -2.24 200 66.000 67.500 2.27 600 54.000 53.400 -1.11
  • 7. All Rights Reserved Copyright (C) Bee Technologies Inc. 2014 7 V1 0Vdc R1 100m 0 U1 SCS215AE_P R2 100MEG V_V1 0V 200V 400V 600V I(R1) 10nA 100nA 1.0uA 10uA 100uA Reverse Characteristic Circuit Simulation result Evaluation circuit
  • 8. All Rights Reserved Copyright (C) Bee Technologies Inc. 2014 8 Comparison Graph Circuit Simulation result Comparison table IR (uA) VR (V) %Error Measurement Simulation 0.01 406.0 397.1 -2.19 0.1 486.0 487.3 0.27 2.1 600.0 598.8 -0.20