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Device Modeling Report



COMPONENTS: MOSFET (Professional Model)
PART NUMBER: 2SK3058
MANUFACTURER: NEC Corporation
REMARK: Body Diode (Professional Model) /
ESD Protection Diode




                  Bee Technologies Inc.




     All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
MOSFET MODEL PARAMETERS

PSpice model
                                      Model description
 parameter
  LEVEL
      L        Channel Length
     W         Channel Width
     KP        Transconductance
     RS        Source Ohmic Resistance
     RD        Ohmic Drain Resistance
    VTO        Zero-bias Threshold Voltage
    RDS        Drain-Source Shunt Resistance
    TOX        Gate Oxide Thickness
   CGSO        Zero-bias Gate-Source Capacitance
  CGDO         Zero-bias Gate-Drain Capacitance
    CBD        Zero-bias Bulk-Drain Junction Capacitance
     MJ        Bulk Junction Grading Coefficient
     PB        Bulk Junction Potential
     FC        Bulk Junction Forward-bias Capacitance Coefficient
    RG         Gate Ohmic Resistance
     IS        Bulk Junction Saturation Current
      N        Bulk Junction Emission Coefficient
     RB        Bulk Series Resistance
    PHI        Surface Inversion Potential
  GAMMA        Body-effect Parameter
  DELTA        Width effect on Threshold Voltage
    ETA        Static Feedback on Threshold Voltage
  THETA        Mobility Modulation
  KAPPA        Saturation Field Factor
   VMAX        Maximum Drift Velocity of Carriers
     XJ        Metallurgical Junction Depth
    UO         Surface Mobility




           All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
Transconductance Characteristics

Circuit Simulation Result

                           100
                                                Measurement
                                                Simulation
 TRANSCONDUCTANCE Gfs(s)




                           10




                            1
                                 0                4               8              12            16               20

                                                              DRIAN CURRENT ID (A)


Comparison table

                                                                        gfs(s)
                                     Id(A)                                                                  Error(%)
                                                      Measurement                Simulation
                                      1                        13.6986                     13.7800             0.5940
                                      2                        17.1253                     17.0000            -0.7317
                                      5                        25.0000                     25.1235             0.4942
                                      10                       36.0101                     36.2158             0.5712
                                      20                       60.0000                     59.8892            -0.1847




                                             All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
Vgs-Id Characteristics

Circuit Simulation Result

   100A




    10A




   1.0A
          0V     0.5V        1.0V   1.5V       2.0V   2.5V    3.0V       3.5V     4.0V   4.5V
               I(V2)
                                                      V_VGS


Evaluation circuit

                                                       V2




                                                 U1 2SK3058




                                                                         VDD
                                                                          10Vdc

                     VGS
                     0Vdc


                 0                                                   0
                                           0




                            All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
Comparison Graph

Circuit Simulation Result

                             100
                                              Measurement
                                              Simulation
     ID - Drain Current -A




                              10




                               1
                                   1                     2                      3                        4
                                                     VGS - Gate to Source Voltage - V

Comparison table


                                                                VGS(V)
                             ID(A)            Measurement                 Simulation                  Error (%)
                              1                              2.1700                  2.1786                  0.3963
                              2                              2.2800                  2.2633                  -0.7325
                              5                              2.4500                  2.4426                  -0.3020
                              10                             2.6500                  2.6609                  0.4113
                              20                             2.9600                  2.9900                  1.0135




                                       All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
*Rds(on) Characteristic

Circuit Simulation result
   28.0A


   25.2A


   22.4A


   19.6A


   16.8A


   14.0A


   11.2A


    8.4A


    5.6A


    2.8A


      0A
           0V     0.1V        0.2V    0.3V        0.4V   0.5V          0.6V   0.7V   0.8V   0.9V
                I(V2)
                                                         V_VDD

Evaluation circuit

                                             V2




                                     U1   2SK3058




                                                              VDD
                                                               10Vdc
                      VGS
                      10Vdc



                  0                                       0
                                0



Simulation Result

      ID=28A, VGS=10V                         Measurement                       Simulation         Error (%)
                R DS (on)                           12.000 m                    12.017 m            0.1416




                        All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
Gate Charge Characteristic

Circuit Simulation result
   10V




    8V




    6V




    4V




    2V




    0V
         0       10n      20n           30n     40n      50n        60n        70n         80n      90n 100n
              V(W1:3)
                                                      Time*1.0mA

Evaluation circuit

                                                                          Vsense




                                                                 U1 2SK3058
                                                                                                    I1
                                                                                            D1
                                                                                           Dbreak   55Adc

                                W1
                                 +
                                 -
             I2                W                                                                    VD
                         ION = 0A                                                                   48Vdc
                         IOFF = 1.1mA


                                                             0



Simulation Result


             VDD=48V,ID=55A
                ,VGS=10V                      Measurement                  Simulation                    Error (%)
                   Qgs                                7.00     nC                   6.69     nC              -4.4285
                  Qgd                             18.00        nC                  18.73     nC               4.0555
                   Qg                             46.00        nC                  44.40     nC              -3.4782


                        All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
Capacitance Characteristic




                                                            Measurement
                                                            Simulation




Simulation Result


                                         Cbd(pF)
           VDS(V)                                                        Error(%)
                           Measurement             Simulation
             1                      780.000                779.625               -0.048
             2                      610.000                615.899                0.967
              5                     420.000                430.794                2.570
             10                     330.000                321.183               -2.672
             20                     245.000                237.566               -3.034
             50                     150.000                158.466                5.644




                  All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
Switching Time Characteristic

Circuit Simulation result

   12V

   11V

   10V

    9V

    8V

    7V

    6V

    5V

    4V

    3V

    2V

    1V

    0V
    0.8us                          1.0us                      1.2us                      1.4us
        V(L3:2)           V(3)/3
                                                   Time

Evaluation circuit

                                                                       Vsense            RL
                                                              3

                                                                                         10

         V1 = 0                                                         U1 2SK3058_pro
                             R1            L3
         V2 = 20                                          2
                             10
         TD = 1u                           30nH                                                  VD
                                                                                                   30Vdc
         TR = 10n    V1
                                     R2
         TF = 10n                     10

         PW = 10u

         PER = 10m

                                                                  0



Simulation Result

          ID=28A, VDD=30V
                                       Measurement                    Simulation         Error(%)
             VGS=0/10V
               td (on)                          36.000 ns         36.012         ns           0.0333




                      All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
Output Characteristic

Circuit Simulation result

   100A


    90A
                                             VGS=10V
    80A


    70A


    60A


    50A                                                                      VGS= 4.0V

    40A


    30A


    20A


    10A


     0A
          0V       0.5V        1.0V     1.5V     2.0V          2.5V   3.0V      3.5V   4.0V
               I(V2)
                                                 V_VDS

Evaluation circuit

                                       V2




                                U1 2SK3058



                                                      VDS
                                                       10Vdc

                   VGS
                   10Vdc




                           0                      0




                     All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
BODY DIODE SPICE MODEL
Forward Current Characteristic

Circuit Simulation Result



     100A




      10A




     1.0A




    100mA




     10mA
            0V                          0.5V       1.0V             1.5V           2.0V
                 I(R1)
                                                   V_V1


Evaluation Circuit

                                   V2



                                                            VGS

                                                            0Vdc

                         VDS

                     0Vdc


                                               U1 2SK3058




                               0




                         All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
Comparison Graph

Circuit Simulation Result

                                  1000
                                                    Measurement
                                                    Simulation

                                   100
      Diode Forward Current - A




                                    10



                                     1



                                   0.1



                                  0.01
                                         0               0.5                1                   1.5     2
                                                                  Source to Drain Voltage - V

Simulation Result

                                                                  VDS(V)
                                    IDR(A)             Measurement       Simulation                   %Error
                                      0.1                     0.5950           0.5967                   0.2857
                                      0.2                     0.6220           0.6211                  -0.1447
                                      0.5                     0.6550           0.6546                  -0.0611
                                       1                      0.6810           0.6804                  -0.0881
                                       2                      0.7100           0.7084                  -0.2254
                                       5                      0.7540           0.7515                  -0.3316
                                       10                     0.7920           0.7936                   0.2020
                                       20                     0.8600           0.8570                  -0.3488
                                       50                     1.0100           1.0000                  -0.9901
                                      100                     1.2000           1.2144                   1.2000
                                      200                     1.6200           1.6144                  -0.3457




                                             All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
Reverse Recovery Characteristic

Circuit Simulation Result
    400mA


    300mA


    200mA


    100mA


     -0mA


   -100mA


   -200mA


   -300mA


   -400mA
      14.96us    15.04us            15.12us        15.20us        15.28us 15.36us
           I(R1)
                                              Time
Evaluation Circuit

                                    R1

                                    50
             V1 = -9.5V

             V2 = 10.5                                 U1   D2SK3058_pro

             TD = 50n      V1

             TR = 10n

             TF = 10n

             PW = 15us

             PER = 100us



                           0



Compare Measurement vs. Simulation

                                Measurement                 Simulation              Error (%)
            trj                          32.000   ns             32.021    ns             0.065
            trb                          51.000   ns             51.210    ns             0.411
            trr                          83.000   ns             83.321    ns            0.3867




                     All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
Reverse Recovery Characteristic                                            Reference




Trj=32(ns)
Trb=51(ns)
Conditions:Ifwd=0.2,lrev=0.2(A),Rl=50




                                                       Example




                                 Relation between trj and trb




                All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
ESD PROTECTION DIODE SPICE MODEL
Zener Voltage Characteristic
Circuit Simulation Result

   10mA

    9mA

    8mA

    7mA

    6mA

    5mA

    4mA

    3mA

    2mA

    1mA

     0A
          0V      5V        10V   15V       20V    25V    30V    35V   40V   45V 50V
               I(V2)
                                                  V_VGS

Evaluation Circuit



                                            U1 2SK3058
                       V2



                                                          ID

                                                          0Adc
                 VGS
                 0Vdc




                                        0




                       All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
Zener Voltage Characteristic                                            Reference




             All Rights Reserved Copyright (c) Bee Technologies Inc. 2006

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SPICE MODEL of 2SK3058 (Professional+BDP Model) in SPICE PARK

  • 1. Device Modeling Report COMPONENTS: MOSFET (Professional Model) PART NUMBER: 2SK3058 MANUFACTURER: NEC Corporation REMARK: Body Diode (Professional Model) / ESD Protection Diode Bee Technologies Inc. All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
  • 2. MOSFET MODEL PARAMETERS PSpice model Model description parameter LEVEL L Channel Length W Channel Width KP Transconductance RS Source Ohmic Resistance RD Ohmic Drain Resistance VTO Zero-bias Threshold Voltage RDS Drain-Source Shunt Resistance TOX Gate Oxide Thickness CGSO Zero-bias Gate-Source Capacitance CGDO Zero-bias Gate-Drain Capacitance CBD Zero-bias Bulk-Drain Junction Capacitance MJ Bulk Junction Grading Coefficient PB Bulk Junction Potential FC Bulk Junction Forward-bias Capacitance Coefficient RG Gate Ohmic Resistance IS Bulk Junction Saturation Current N Bulk Junction Emission Coefficient RB Bulk Series Resistance PHI Surface Inversion Potential GAMMA Body-effect Parameter DELTA Width effect on Threshold Voltage ETA Static Feedback on Threshold Voltage THETA Mobility Modulation KAPPA Saturation Field Factor VMAX Maximum Drift Velocity of Carriers XJ Metallurgical Junction Depth UO Surface Mobility All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
  • 3. Transconductance Characteristics Circuit Simulation Result 100 Measurement Simulation TRANSCONDUCTANCE Gfs(s) 10 1 0 4 8 12 16 20 DRIAN CURRENT ID (A) Comparison table gfs(s) Id(A) Error(%) Measurement Simulation 1 13.6986 13.7800 0.5940 2 17.1253 17.0000 -0.7317 5 25.0000 25.1235 0.4942 10 36.0101 36.2158 0.5712 20 60.0000 59.8892 -0.1847 All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
  • 4. Vgs-Id Characteristics Circuit Simulation Result 100A 10A 1.0A 0V 0.5V 1.0V 1.5V 2.0V 2.5V 3.0V 3.5V 4.0V 4.5V I(V2) V_VGS Evaluation circuit V2 U1 2SK3058 VDD 10Vdc VGS 0Vdc 0 0 0 All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
  • 5. Comparison Graph Circuit Simulation Result 100 Measurement Simulation ID - Drain Current -A 10 1 1 2 3 4 VGS - Gate to Source Voltage - V Comparison table VGS(V) ID(A) Measurement Simulation Error (%) 1 2.1700 2.1786 0.3963 2 2.2800 2.2633 -0.7325 5 2.4500 2.4426 -0.3020 10 2.6500 2.6609 0.4113 20 2.9600 2.9900 1.0135 All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
  • 6. *Rds(on) Characteristic Circuit Simulation result 28.0A 25.2A 22.4A 19.6A 16.8A 14.0A 11.2A 8.4A 5.6A 2.8A 0A 0V 0.1V 0.2V 0.3V 0.4V 0.5V 0.6V 0.7V 0.8V 0.9V I(V2) V_VDD Evaluation circuit V2 U1 2SK3058 VDD 10Vdc VGS 10Vdc 0 0 0 Simulation Result ID=28A, VGS=10V Measurement Simulation Error (%) R DS (on) 12.000 m 12.017 m 0.1416 All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
  • 7. Gate Charge Characteristic Circuit Simulation result 10V 8V 6V 4V 2V 0V 0 10n 20n 30n 40n 50n 60n 70n 80n 90n 100n V(W1:3) Time*1.0mA Evaluation circuit Vsense U1 2SK3058 I1 D1 Dbreak 55Adc W1 + - I2 W VD ION = 0A 48Vdc IOFF = 1.1mA 0 Simulation Result VDD=48V,ID=55A ,VGS=10V Measurement Simulation Error (%) Qgs 7.00 nC 6.69 nC -4.4285 Qgd 18.00 nC 18.73 nC 4.0555 Qg 46.00 nC 44.40 nC -3.4782 All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
  • 8. Capacitance Characteristic Measurement Simulation Simulation Result Cbd(pF) VDS(V) Error(%) Measurement Simulation 1 780.000 779.625 -0.048 2 610.000 615.899 0.967 5 420.000 430.794 2.570 10 330.000 321.183 -2.672 20 245.000 237.566 -3.034 50 150.000 158.466 5.644 All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
  • 9. Switching Time Characteristic Circuit Simulation result 12V 11V 10V 9V 8V 7V 6V 5V 4V 3V 2V 1V 0V 0.8us 1.0us 1.2us 1.4us V(L3:2) V(3)/3 Time Evaluation circuit Vsense RL 3 10 V1 = 0 U1 2SK3058_pro R1 L3 V2 = 20 2 10 TD = 1u 30nH VD 30Vdc TR = 10n V1 R2 TF = 10n 10 PW = 10u PER = 10m 0 Simulation Result ID=28A, VDD=30V Measurement Simulation Error(%) VGS=0/10V td (on) 36.000 ns 36.012 ns 0.0333 All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
  • 10. Output Characteristic Circuit Simulation result 100A 90A VGS=10V 80A 70A 60A 50A VGS= 4.0V 40A 30A 20A 10A 0A 0V 0.5V 1.0V 1.5V 2.0V 2.5V 3.0V 3.5V 4.0V I(V2) V_VDS Evaluation circuit V2 U1 2SK3058 VDS 10Vdc VGS 10Vdc 0 0 All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
  • 11. BODY DIODE SPICE MODEL Forward Current Characteristic Circuit Simulation Result 100A 10A 1.0A 100mA 10mA 0V 0.5V 1.0V 1.5V 2.0V I(R1) V_V1 Evaluation Circuit V2 VGS 0Vdc VDS 0Vdc U1 2SK3058 0 All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
  • 12. Comparison Graph Circuit Simulation Result 1000 Measurement Simulation 100 Diode Forward Current - A 10 1 0.1 0.01 0 0.5 1 1.5 2 Source to Drain Voltage - V Simulation Result VDS(V) IDR(A) Measurement Simulation %Error 0.1 0.5950 0.5967 0.2857 0.2 0.6220 0.6211 -0.1447 0.5 0.6550 0.6546 -0.0611 1 0.6810 0.6804 -0.0881 2 0.7100 0.7084 -0.2254 5 0.7540 0.7515 -0.3316 10 0.7920 0.7936 0.2020 20 0.8600 0.8570 -0.3488 50 1.0100 1.0000 -0.9901 100 1.2000 1.2144 1.2000 200 1.6200 1.6144 -0.3457 All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
  • 13. Reverse Recovery Characteristic Circuit Simulation Result 400mA 300mA 200mA 100mA -0mA -100mA -200mA -300mA -400mA 14.96us 15.04us 15.12us 15.20us 15.28us 15.36us I(R1) Time Evaluation Circuit R1 50 V1 = -9.5V V2 = 10.5 U1 D2SK3058_pro TD = 50n V1 TR = 10n TF = 10n PW = 15us PER = 100us 0 Compare Measurement vs. Simulation Measurement Simulation Error (%) trj 32.000 ns 32.021 ns 0.065 trb 51.000 ns 51.210 ns 0.411 trr 83.000 ns 83.321 ns 0.3867 All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
  • 14. Reverse Recovery Characteristic Reference Trj=32(ns) Trb=51(ns) Conditions:Ifwd=0.2,lrev=0.2(A),Rl=50 Example Relation between trj and trb All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
  • 15. ESD PROTECTION DIODE SPICE MODEL Zener Voltage Characteristic Circuit Simulation Result 10mA 9mA 8mA 7mA 6mA 5mA 4mA 3mA 2mA 1mA 0A 0V 5V 10V 15V 20V 25V 30V 35V 40V 45V 50V I(V2) V_VGS Evaluation Circuit U1 2SK3058 V2 ID 0Adc VGS 0Vdc 0 All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
  • 16. Zener Voltage Characteristic Reference All Rights Reserved Copyright (c) Bee Technologies Inc. 2006